Automotive electronics solutions at AESIN Conference 2021

A successful Automotive Electronics Innovation (AESIN) conference at the UK’s National Motorcycle Museum in Solihull…

Tessent at 2021 Automotive Electronics Innovation (AESIN) Conference

Siemens is a headline sponsor of the 2021 Automotive Electronics Innovation (AESIN) Conference taking place…

Don’t miss it: Automotive Test and Reliability at ITC-Asia 2021

At the 2021 IEEE International Test Conference, Tessent experts are presenting on bringing 1149.10 to…

Manage automotive test, safety, and security with a safety island

The makers of automotive ICs are living in “interesting times.” These ICs no longer only run…

Secure and Up-to-date: Monitor and Control Automotive devices with Over-the-Air Updates

By Lee Harrison – Automotive Test Solutions Manager, Siemens EDA The topic of safety and…

Tessent LBIST with Observation Scan Technology Wins Elektra Design Tool Award 2020

A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at…

Video: ITC India 2020 keynote—Test community can take on silicon lifecycle challenges

The role of test is expanding from its traditional role into one that includes managing…

Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

By Rahul Singhal, Mentor Graphics Near-zero defect testing for safety-critical ICs means also testing the…