Tessent at 2021 Automotive Electronics Innovation (AESIN) Conference

Siemens is a headline sponsor of the 2021 Automotive Electronics Innovation (AESIN) Conference taking place at the UK’s National Motorcycle…

Don’t miss it: Automotive Test and Reliability at ITC-Asia 2021

At the 2021 IEEE International Test Conference, Tessent experts are presenting on bringing 1149.10 to life, progress in scan test…

Manage automotive test, safety, and security with a safety island

The makers of automotive ICs are living in “interesting times.” These ICs no longer only run simple functions such as window…

Secure and Up-to-date: Monitor and Control Automotive devices with Over-the-Air Updates

By Lee Harrison – Automotive Test Solutions Manager, Siemens EDA The topic of safety and security for automotive ICs and…

Tessent LBIST with Observation Scan Technology Wins Elektra Design Tool Award 2020

A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from a crowded field of nominated…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at Mentor, a Siemens business. These…

Video: ITC India 2020 keynote—Test community can take on silicon lifecycle challenges

The role of test is expanding from its traditional role into one that includes managing the entire silicon lifecycle. To…

Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

By Rahul Singhal, Mentor Graphics Near-zero defect testing for safety-critical ICs means also testing the DFT logic.

Automotive Semiconductor Test

Automotive Semiconductor Test

By Steve Pateras, Mentor Graphics Ensure quality and reliability in automotive ICs with the newest technologies in silicon test.