The role of test is expanding from its traditional role into one that includes managing the entire silicon lifecycle. To…
By Rahul Singhal, Mentor Graphics Near-zero defect testing for safety-critical ICs means also testing the DFT logic.
By Steve Pateras, Mentor Graphics Ensure quality and reliability in automotive ICs with the newest technologies in silicon test.
By Steve Pateras, Mentor Graphics Memory BIST is evolving to meet the demands of automotive ICs.
