Industry: Electronics & Semiconductors

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Image showing the architecture of a bus-based packetized scan test delivery system. Each core’s DFT can be designed independently and with the most optimal compression configuration.

Video: Generating clocks in Tessent Streaming Scan Network

June 12, 2023

Learn about generating clocks in Tessent Streaming Scan Network (SSN) in this presentation and Q&A recorded at the 2023 U2U North America.

By Tessent Solutions
< 1 MIN READ

A new way to solve systematic failures and boost yield

April 21, 2023

A novel approach from Siemens and PDF Solutions shows promise in speeding yield ramp on advanced nodes and solving yield…

By Tessent Solutions
5 MIN READ

The future of in-system testing for automotive safety

April 7, 2023

Suppliers of IP for automotive applications must ensure their IP blocks are ISO 26262 compliant. Siemens has the solutions for automotive safety and reliability.

By Tessent Solutions
3 MIN READ

Don’t Miss Silicon Lifecycle Solutions at U2U

March 27, 2023

Don’t miss the exciting lineup of Tessent Test and Embedded Analytics presentations at U2U North America on A[ril 13, 2023.

By Tessent Solutions
4 MIN READ

On-demand Webinar: Faster DFT, better results

March 24, 2023

Learn about faster DFT and better results using the bus-based packetized test of Tessent Streaming Scan Network.

By Tessent Solutions
3 MIN READ

Event: Tessent 2023 DFT Tech Forum

March 15, 2023

Attend the 2023 DFT Tech Forum to learn how Tessent silicon lifecycle solutions solve your complex SoC DFT challenges.

By Tessent Solutions
2 MIN READ

Webinar: How to implement DFT in 2.5/3D designs using Tessent Test software

December 5, 2022

Watch this on-demand webinar to learn about how the new Tessent Multi-die software automates the complex DFT tasks associated with 2.5D and 3D IC designs.

By Tessent Solutions
1 MIN READ

Message-based connections enable system-level debug and validation

October 28, 2022

Secure Message Infrastructure is a scalable, message-based on-chip communications fabric that facilitates system-level debug and validation by allowing configuration of on-chip Embedded Analytics IP, cross-triggering and data capture

By andy.gothard
3 MIN READ
DFT for tile-based design

How to master DFT for tile-based designs

October 23, 2022

Hierarchical designs that are tile-based or abutment based physical blocks are predominant in today’s chips. Having no logic present at the chip-level calls for new approaches to testing these tile-based architectures. How a design for test (DFT) architecture can support tile-based designs is the focus of this presentation from U2U 2022.

By Tessent Solutions
2 MIN READ