Wireframe image of a futuristic car

Security by design: a discussion on automotive cybersecurity with Siraj Shaikh

Host Lee Harrison and his guest Siraj Shaikh discuss whether we will ever see self-driving vehicles, the current state of cybersecurity for vehicles, and how do compliance and regulations fit into the big picture?

Debugging RISC-V processors using E-Trace

Tessent Embedded Analytics offers an integrated range of hardware and software tools that accelerate debug of RISC-V based SoCs.

RISC-V – It’s not just about the core, it’s also about the system

Tessent Embedded Analytics offers an integrated range of hardware and software tools that accelerate debug of RISC-V based SoCs.

Debugging a RISC-V processor requires integrated hardware and software tools

Debugging a RISC-V processor requires integrated hardware and software tools

Tessent Embedded Analytics offers an integrated range of hardware and software tools that accelerate debug of RISC-V based SoCs.

Image showing the architecture of a bus-based packetized scan test delivery system. Each core’s DFT can be designed independently and with the most optimal compression configuration.

Video: System-on-chip ATPG with Tessent SSN

Learn how Intel adopted Tessent SSN packet-based ATPG and reduced test time by 34% in this video recorded at the 2023 North America U2U symposium.

Video: Developing DFT flow for 3D IC at Broadcom

Learn how Broadcom used Tessent Multi-die to build a 3D IC flow in this video recorded at the 2023 North America U2U symposium.

Video: Using defect oriented test to target bridges in automotive designs

Learn how NXP achieves zero defects for bridging defects with Tessent’s defect oriented test in this video recorded at the 2023 North America U2U symposuim.

Video: Break through yield barriers with Siemens and PDF

Break through yield barriers with Siemens and PDF Solutions. Watch this video recorded at the 2023 North America U2U symposuim.

Register for the SAFE Forum: Siemens presents safety island and more

Learn about using a safety island for effective control and monitoring of automotive ICs.