Technical innovation, EDA market growth, the value of industry consortiums, how trends such as big data impact the semiconductor industry…
Mentor’s user group event this year is located at the Santa Clara Marriott on April 4, 2017. Here’s what you…
By Ron Press, Mentor Graphics The no money down, no design change way to benefit from hierarchical DFT
Use bench-top ATPG bring-up to better understand and interact with silicon bring-up test data and reduce silicon bring-up cycle time….
By Steve Pateras, Mentor Graphics Ensuring safety and reliability of automotive ICs takes a full life-cycle view of automotive test…
Dr. Wally Rhines, the chairman and CEO of Mentor Graphics is one of the most dynamic and engaging speakers in…
By Jay Jahangiri and Wu Yang, Mentor Graphics By creating and applying scan patterns in the right order, you can…
Improve yield and failure analysis by identifying defects inside standard cells. Learn more in this new whitepaper.
By Geir Eide, Mentor Graphics Need to diagnose silicon failures faster and with more accuracy? Try the new cell-aware diagnosis…
