Expose Transistor-level Yield Limiters with Cell-aware Diagnosis

Improve yield and failure analysis by identifying defects inside standard cells. Learn more in this new whitepaper.

Cell-aware diagnosis is a new and effective method to perform transistor-level diagnosis to identify defects inside standard cells. It leverages fault models derived from analog simulation and uses a fail data collection and diagnosis flow identical to that of traditional diagnosis. Cell-aware diagnosis in Tessent® Diagnosis is the result of over 10 years of research in cell-aware test and was developed in collaboration with fabless semiconductor manufacturers, foundries, and integrated device manufacturers.

Read more in this white paper