Expose Transistor-level Yield Limiters with Cell-aware Diagnosis

Improve yield and failure analysis by identifying defects inside standard cells. Learn more in this new whitepaper.

 

Cell-aware diagnosis is a new and effective method to perform transistor-level diagnosis to identify defects inside standard cells. It leverages fault models derived from analog simulation and uses a fail data collection and diagnosis flow identical to that of traditional diagnosis. Cell-aware diagnosis in Tessent® Diagnosis is the result of over 10 years of research in cell-aware test and was developed in collaboration with fabless semiconductor manufacturers, foundries, and integrated device manufacturers.

Read more in this white paper

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This article first appeared on the Siemens Digital Industries Software blog at https://blogs.sw.siemens.com/tessent/2017/02/07/expose-transistor-level-yield-limiters-with-cell-aware-diagnosis/