A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive devices.
Excerpt from article: “Improving Algorithms With High-Level Synthesis” Most computer algorithms today are developed in high-level languages on general-purpose computers….
Learn about how Mentor and our partners, Advantest and Teradyne, are getting behind the IEEE 1149.10 standard for re-use of…
At the Silicon Valley DFT and Test Conference in Santa Clara, CA on October 23, the tight-knit community of DFT…
In 1970, the Beatles officially split, Apollo 13 narrowly averted disaster, paisley and stripes somehow went together, and the International…
Performing volume scan diagnosis on today’s large, advanced node designs puts outsized demands on turn-around-time and compute resources. Mentor offers…
Excerpt from article: “Master the design and verification of next gen transport: Part Two – high-level synthesis” Part one of…
Excerpt from article: “AI Hardware Summit, Report#2: Lowering Power at the Edge with HLS” I previously wrote a blog about a…
Excerpt from article: “Master the design and verification of next gen transport: Part One – overview” The role of high-level…
