Performing volume scan diagnosis on today’s large, advanced node designs puts outsized demands on turn-around-time and compute resources. Mentor offers…
When faced with a complex problem, engineers often employ a divide and conquer approach to efficiently come up with a…
The rapid development of advanced driver assistance systems and autonomous vehicles has grabbed the world’s attention and imagination. While true…
Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly…
At the recently concluded ITC India conference, Mentor experts presented the two highest-attended tutorials. One tutorial was AI Chip Technologies…
The new reference flow jointly developed by Arm and Mentor for hierarchical DFT and ATPG with Tessent is described in…
This video, the last in a series of three, discusses the Tessent platform capabilities and the reference flows, test cases,…
DFT designers often use boundary scan chains for 1149.1 or 1149.6 interconnect tests. This video provides tips on how to…
Learn about the DFT logic that can be used to disable and enable sets/resets.
