Join Tessent at the VOICE Developer Conference

Tessent invites you to join us at the upcoming VOICE Developer Conference happening virtually from June 21-23, 2021. VOICE is…

RealizeLIVE + User2User

Don’t miss these Tessent sessions at Realize LIVE + User2User event – May 26, 2021

Explore the latest DFT, operations and embedded analytics technologies at Realize LIVE + U2U 2021. The May 26, 2021 user…

Manage the effects of chip complexity with Embedded Analytics

By Richard Oxland – Siemens Digital Industries Software If you’ve never heard of Embedded Analytics, it’s time to learn how…

VTS 2020 best paper_Tessent

Tessent wins Best Paper award at IEEE VLSI Test Symposium

The best paper of the 2020 symposium describes a layout-friendly EDT decompressor that reduces routing congestion associated with decompressor circuitry…

Secure and Up-to-date: Monitor and Control Automotive devices with Over-the-Air Updates

By Lee Harrison – Automotive Test Solutions Manager, Siemens EDA The topic of safety and security for automotive ICs and…

Improve defect detection for competitive, high-quality SoCs

To deliver the highest quality SoCs, these manufacturing test strategies ensure defects are detected before it’s too late. It is…

Introducing Tessent Streaming Scan Network

Slash test costs and reduce implementation effort for complex next-generation SoCs. IC engineering teams have seen a dramatic rise in…

Tessent’s ITC 2020 wrap-up

The International Test Conference carried on this year as a virtual event. It’s a difficult format to make work, but…

DFT and the competitive edge

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of glory. This one will be…