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yield ramp

ISTFA 2021

October 28, 2021

Don’t miss the 47th International Symposium for Testing and Failure Analysis (ISTFA 2021) in Phoenix, Arizona from October 31 to…

By Tessent Solutions
2 MIN READ

Webinar: Reversible Scan Chain Technology Improves Diagnosis Resolution by 4X

September 20, 2021

Join Siemens and Qualcomm experts for a live, one-hour, online seminar: A Novel Reversible Scan Chain Technology that Improves Chain…

By Tessent Solutions
2 MIN READ
Best practice in scan pattern ordering for test and diagnosis

Best practice in scan pattern ordering for test and diagnosis

February 14, 2017

By Jay Jahangiri and Wu Yang, Mentor Graphics By creating and applying scan patterns in the right order, you can…

By Tessent Solutions
4 MIN READ
Pattern Matching in Test and Yield Analysis

Pattern Matching in Test and Yield Analysis

August 1, 2016

By Geir Eide and Jonathan Muirhead Analyzing fail data with pattern matching helps companies identify yield limiters faster to increase…

By Tessent Solutions
4 MIN READ