Don’t miss the 47th International Symposium for Testing and Failure Analysis (ISTFA 2021) in Phoenix, Arizona from October 31 to…
Join Siemens and Qualcomm experts for a live, one-hour, online seminar: A Novel Reversible Scan Chain Technology that Improves Chain…
By Jay Jahangiri and Wu Yang, Mentor Graphics By creating and applying scan patterns in the right order, you can…
By Geir Eide and Jonathan Muirhead Analyzing fail data with pattern matching helps companies identify yield limiters faster to increase…
