Don’t miss the 47th International Symposium for Testing and Failure Analysis (ISTFA 2021) in Phoenix,…
Join Siemens and Qualcomm experts for a live, one-hour, online seminar: A Novel Reversible Scan…
By Jay Jahangiri and Wu Yang, Mentor Graphics By creating and applying scan patterns in…
By Geir Eide and Jonathan Muirhead Analyzing fail data with pattern matching helps companies identify…
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