Navigating Tessent OCCs and Beyond: A Comprehensive Guide to On-Chip Clock Controllers
In today’s rapidly evolving semiconductor landscape, ensuring the robustness and reliability of integrated circuits is paramount. Embedded within these circuits are On-Chip Clock Controllers (OCCs), crucial components that facilitate the generation and management of programmable clock pulses during testing phases.
Tessent Shell empowers designers with the ability to seamlessly integrate Tessent OCCs into their designs, offering a comprehensive suite of features to streamline testing processes. Whether it’s FastScan and TestKompress for ATPG or TK/LBIST Hybrid Controller, Tessent OCCs provide the necessary tools to navigate complex testing scenarios with ease as well as enabling them to make informed decisions about their clock control solutions. Additionally, Tessent offers multiple types of OCCs, providing users with flexibility in choosing the most suitable option for their requirements. Here is an application note that describes the difference between standard OCCs and non-standard OCCs.
Incorporating Scan Streaming Network (SSN) technology into semiconductor testing processes offers significant advantages. SSN delivers packetized data to cores at the SSN bus clock frequency, optimizing test efficiency and data throughput. This synchronized data delivery is made possible by the collaboration with OCC’s, which are pivotal in clocking flops within the block at their respective functional frequencies. Leveraging these OCCs, SSN ensures precise synchronization of test operations, enhancing the reliability and accuracy of semiconductor testing. With careful planning and adherence to prescribed methodologies, integrating non-Tessent OCCs becomes achievable, ensuring the compatibility and efficiency of testing procedures.
For Support and training information on Tessent OCC’s and how it is handled with SSN based designs, please refer to Support Center https://support.sw.siemens.com and Siemens’ Xcelerator Academy Siemens Xcelerator Academy
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