Simulation debug capabilities of ATPG: A method to check the values simulated

ATPG’s goal is to create a set of patterns that achieves a given test coverage, where test coverage is the…

Optimizing DFT efficiency: Essential guidelines for SSN Bus Width and EDT channels

For an SSN design, only the SSN bus data in, SSN bus data out, SSN bus clock, and the TAP…

Advantages Of Using Tessent Shell For LogicBist Built-in Self Test Implementation

Logic Built-In Self-Test (LogicBIST/LBIST) embeds test circuitry directly within a chip, making it an essential feature for modern integrated circuit…

Reduce Your Tessent MemoryBIST Simulation Debug Time

Modern technologies like AI, IoT and other smart systems need a large amount of data storage leading to an increase…

Introduction to Tessent Multi-Die

With the latest developments in the electronic industry, supporting revolutionary complex systems such as Autonomous vehicles or AI products/chips system-in-package…

Diagnosis-Driven Yield Analysis

Tessent Diagnosis leverages failure data from manufacturing tests, scan test patterns, and design information to pinpoint and classify defects causing…

Diverse Ways To use Algorithms With Programmable Controllers in Tessent Memory BIST

As part of the Tessent Memory BIST solution, Siemens provides a library of test patterns or algorithms for testing your…

Tessent SSN and Data Packets

The Tessent Scan Streaming Network (SSN) is a powerful tool that facilitates efficient testing of integrated circuits (ICs) by optimizing…

Navigating Tessent OCCs and Beyond: A Comprehensive Guide to On-Chip Clock Controllers

In today’s rapidly evolving semiconductor landscape, ensuring the robustness and reliability of integrated circuits is paramount. Embedded within these circuits…