The BISR controller is at the heart of the Tessent Platform repair solution. It facilitates access to the BISR chains…
A tap controller, or Test Access Port (TAP) controller, is a critical component in the design-for-test (DFT) methodology used in…
ATPG’s goal is to create a set of patterns that achieves a given test coverage, where test coverage is the…
For an SSN design, only the SSN bus data in, SSN bus data out, SSN bus clock, and the TAP…
Modern technologies like AI, IoT and other smart systems need a large amount of data storage leading to an increase…
With the latest developments in the electronic industry, supporting revolutionary complex systems such as Autonomous vehicles or AI products/chips system-in-package…
Tessent Diagnosis leverages failure data from manufacturing tests, scan test patterns, and design information to pinpoint and classify defects causing…
As part of the Tessent Memory BIST solution, Siemens provides a library of test patterns or algorithms for testing your…
The Tessent Scan Streaming Network (SSN) is a powerful tool that facilitates efficient testing of integrated circuits (ICs) by optimizing…
