The BISR controller is at the heart of the Tessent Platform repair solution. It facilitates access to the BISR chains…
A tap controller, or Test Access Port (TAP) controller, is a critical component in the design-for-test (DFT) methodology used in…
ATPG’s goal is to create a set of patterns that achieves a given test coverage, where test coverage is the…
For an SSN design, only the SSN bus data in, SSN bus data out, SSN bus clock, and the TAP…
Logic Built-In Self-Test (LogicBIST/LBIST) embeds test circuitry directly within a chip, making it an essential feature for modern integrated circuit…
Modern technologies like AI, IoT and other smart systems need a large amount of data storage leading to an increase…
With the latest developments in the electronic industry, supporting revolutionary complex systems such as Autonomous vehicles or AI products/chips system-in-package…
Tessent Diagnosis leverages failure data from manufacturing tests, scan test patterns, and design information to pinpoint and classify defects causing…
As part of the Tessent Memory BIST solution, Siemens provides a library of test patterns or algorithms for testing your…
