: FPGA demo - RISC-V cores and Droop Detector connected to EA infrastructure.

Detect, diagnose, and debug using sensors and functional monitoring

Discover how a Tessent functional monitoring solution, working in conjunction with Movellus Inc. Aeonic Insight™ Droop Detector IP for Power Delivery Network (PDN) telemetry, can provide a multi-instrument monitoring solution that detects a voltage anomaly, and cross-triggers functional monitoring that enables engineers to diagnose issues.

This combined approach provides enhanced visibility and insight, as part of Silicon Lifecycle Management and delivers a more sophisticated approach to monitoring, in order to detect and perform root-cause analysis in-life.

Tessent UltraSight

Beyond the core: Tackling system-wide debugging for complex SoCs with Tessent UltraSight

Tessent UltraSight enables system-wide debugging for complex SoCs. A comprehensive solution, it combines embedded hardware IP with powerful host software to provide deep visibility into complex SoCs, supporting the development and optimization of high-performance embedded software.

Tessent UltraSight-V

Accelerating RISC-V development with Tessent UltraSight-V

Tessent UltraSight-V is a comprehensive debug and trace solution for RISC-V processors that combines embedded IP and software to enable efficient debugging and tracing while integrating with industry-standard tools to support the development of high-performance embedded software.

Maximizing SoC Performance: The Role of Embedded Software and Functional Monitors

In the rapidly evolving landscape of System on Chip (SoC) development, the demand for effective debugging and optimization is becoming…

Enhance safety with Tessent

Enhance safety with Tessent

Learn how to ensure safety for automotive ICs with Tessent solutions from Siemens EDA.

Video: Leveraging the RISC-V efficient trace (E-Trace) standard

Learn more about using the RISC-V efficient trace standard for non-intrusive, full-speed and system-level visibility.

Picture of James Pickford at the Elektra awards banquet.

Awarding excellence: Siemens’ James Pickford wins BrightSparks award

Siemens’ James Pickford wins BrightSparks award.

Video from DAC: IC lifecycle monitoring with Tessent Embedded Analytics

Learn how Tessent Embedded Analytics accelerates SoC debus and ongoing silicon monitoring though the IC lifecycle. This video was recorded at the 2023 Design Automation Conference.

Video: Seagate presents RISC-V debug and optimization with Tessent

Learn how Seagate used Tessent Embedded Analytics for RISC-V debug and optimization in this presentation and Q&A recorded at the 2023 U2U North America.