Siemens Digital Industries Software Blog Network

Siemens Digital Industries Software Blogs



Verification Horizons

From manageability to 3.0: Unlocking the future with UCIe verification

The semiconductor industry is steadily moving toward multi-die integration, where chiplets from different sources are combined within a single package (known as a system in package or SiP) to deliver higher performance, scalability, and efficiency. The Universal Chiplet Interconnect Express (UCIe) standard is the backbone of this movement, offering a high-bandwidth, low-latency interconnect that enables heterogeneous chiplets to operate as one system. UCIe 3.0 raises the bar once again. By adding higher data rates, runtime recalibration, priority sideband messaging, low-power sideband operation, and circular buffer transport, the standard improves both performance and efficiency. But it also increases verification complexity.

Semiconductor Packaging

Unlock advanced chiplet design success: Discover the Siemens EDA Heterogeneous Integration eBook series

The future of semiconductor innovation is rapidly shifting from monolithic chips to advanced, multi-chiplet architectures. As devices demand greater power,...

NX Design

New white paper: Accelerating electric drivetrain innovation through digital transformation

Download “Accelerating electric drivetrain innovation” Electrification in automotive industry We’re excited to announce the release of our latest white paper,...

Teamcenter

Teamcenter X: Unlocking innovation at Lightera

Lightera cut product development time by 25% with Siemens Teamcenter X, streamlining documentation, collaboration, and innovation.

Electronic Systems Design

The invisible backbone of electronics: Why impedance matters more than you think

beneath the surface of every high-performance circuit lies an unsung champion: Impedance (Z).

Automotive & Transportation

Accelerate EV development with a collaborative virtual environment

Our collaborative virtual development environment empowers teams to innovate faster, reduce errors, and improve decision-making throughout the product lifecycle.

EDA Support Blogs

Closing the Gap: How Tessent CellModelGen Elevates Semiconductor Test Accuracy

In today’s semiconductor manufacturing, the pursuit of perfection leaves no room for error. Traditional testing methodologies often miss subtle yet...

Thought Leadership

More Perspectives on the Shift-Left and the Comprehensive Digital Twin with Mike Crist and Scot Morrison – Part 3 – Transcript

The Industry Forward Podcast continued with another three part series on the intricacies of shifting-left with the comprehensive Digital Twin....

Opcenter

Real-Time Brews, Real-Time Gains: FIFCO's Digital Leap with Opcenter and Insights Hub

In a small town in Costa Rica, FIFCO began with a simple ice manufacturing plant 115 years ago. Today, the...