Abracadabra – using Tessent magic to repair non-repairable memories

The cost for silicon at smaller modern technology nodes is inflationary to say the least. Therefore, yield, cannot just be…

ECC in Memory Test and Repair

Error Correction Codes (ECC) have long been a cornerstone of reliable memory design, primarily serving as a shield against transient…

Concurrent BISR: Revolutionizing Memory Repair in Modern Electronics

Concurrent BISR (Built-In Self-Repair) chains refer to a methodology that enables the simultaneous processing of multiple BISR chains during power-up,…

Tessent BISR controller doing a lot more than memory repair

The BISR controller is at the heart of the Tessent Platform repair solution.  It facilitates access to the BISR chains…

Reduce Your Tessent MemoryBIST Simulation Debug Time

Modern technologies like AI, IoT and other smart systems need a large amount of data storage leading to an increase…

Introduction to Tessent Multi-Die

With the latest developments in the electronic industry, supporting revolutionary complex systems such as Autonomous vehicles or AI products/chips system-in-package…

The Roles of Fusebox and its Interface as Part of Tessent Memory BIST Repair Solution

We have multiple inquires about Tessent Memory BIST to understand the Built-in-Self-Repair (BISR) architecture, specifically in regards to the fuse…