In the rapidly evolving field of semiconductor testing, the ability to adapt and optimize test strategies is crucial for achieving…
Boundary scan is an integral part of electronic circuit design, be it system level, PCB level, chip level or physical…
In today’s semiconductor manufacturing, the pursuit of perfection leaves no room for error. Traditional testing methodologies often miss subtle yet…
Concurrent BISR (Built-In Self-Repair) chains refer to a methodology that enables the simultaneous processing of multiple BISR chains during power-up,…
The BISR controller is at the heart of the Tessent Platform repair solution. It facilitates access to the BISR chains…
A tap controller, or Test Access Port (TAP) controller, is a critical component in the design-for-test (DFT) methodology used in…
ATPG’s goal is to create a set of patterns that achieves a given test coverage, where test coverage is the…
For an SSN design, only the SSN bus data in, SSN bus data out, SSN bus clock, and the TAP…
Logic Built-In Self-Test (LogicBIST/LBIST) embeds test circuitry directly within a chip, making it an essential feature for modern integrated circuit…
