VTS 2020 best paper_Tessent

Tessent wins Best Paper award at IEEE VLSI Test Symposium

The best paper of the 2020 symposium describes a layout-friendly EDT decompressor that reduces routing congestion associated with decompressor circuitry…

DFT and the competitive edge

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of glory. This one will be…

What DFT history teaches us

What DFT history teaches us

By Stephen Pateras, Mentor Graphics Two DFT-related rules for success are as true today as they were 30 years ago

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

By Rick Fisette, Mentor Graphics Remove ATPG from the critical path to tapeout with hierarchical DFT plus test pattern retargeting…

Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

By Rahul Singhal, Mentor Graphics Near-zero defect testing for safety-critical ICs means also testing the DFT logic.

Take scan test out of the critical path

Take scan test out of the critical path

By Ron Press, Mentor Graphics DFT with less risk to your design flow? Here’s how.  

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

By Rick Fisette, Mentor Graphics Is DFT a barrier to tapeout? Time to consider going hierarchical.

Addressing Moore’s Law with the First Law of Real Estate: Location, location, location

Addressing Moore’s Law with the First Law of Real Estate: Location, location, location

By Beth Martin with Steve Pateras, Mentor Graphics Mentor’s novel EDT test point technology dramatically reduces ATPG pattern volume

A flexible flow for inserting embedded compression logic in RTL

A flexible flow for inserting embedded compression logic in RTL

By Ron Press, Mentor Graphics Inserting test compression logic just got a lot easier.