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ISTFA 2021

October 28, 2021

Don’t miss the 47th International Symposium for Testing and Failure Analysis (ISTFA 2021) in Phoenix,…

By Tessent Solutions
2 MIN READ
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Webinar: Reversible Scan Chain Technology Improves Diagnosis Resolution by 4X

September 20, 2021

Join Siemens and Qualcomm experts for a live, one-hour, online seminar: A Novel Reversible Scan…

By Tessent Solutions
2 MIN READ
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Tessent scan diagnosis at IPFA

September 14, 2021

IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021) is…

By Tessent Solutions
3 MIN READ
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DFT and the competitive edge

October 13, 2020

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of…

By Tessent Solutions
4 MIN READ
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What to Know about Today’s Scan Diagnosis and Yield Analysis Technologies

August 23, 2016

By Geir Eide, Mentor Graphics What to know about today’s scan diagnosis and yield analysis…

By Tessent Solutions
2 MIN READ
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