At the 2019 International Test conference, Joseph Sawicki, Executive Vice President of IC EDA at Mentor, a Siemens Business, delivered…
An improvement to BIST improves test coverage and time to improve functional safety of automotive ICs
The ICs designed for use in advanced driver assistance systems or autonomous vehicles must meet stringent functional safety standards that…
End-to-End automation keeps DFT out of the critical path
Broadcom developed an advanced, highly automated DFT flow for some of it’s biggest chips targeting the artificial intelligence (AI) market…
Everyone benefits from close collaborations between all the players in the semiconductor ecosystem.
Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and compute resources. Mentor offers a…
A look at the top downloaded Tessent whitepapers reveals DFT challenges
A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive devices.
