DAC was once the playground for the core EDA topics but has broadened in a reflection of the growing connectedness…
The IEEE European Test Symposium takes place from 22-16 May in Limassol, Cyprus. When not contemplating the stunning azure Mediterranean,…
By Vidya Neerkundar, Mentor Graphics Good scan insertion can make a difference in the quality of your automatic test pattern…
Technical innovation, EDA market growth, the value of industry consortiums, how trends such as big data impact the semiconductor industry…
Mentor’s user group event this year is located at the Santa Clara Marriott on April 4, 2017. Here’s what you…
By Ron Press, Mentor Graphics The no money down, no design change way to benefit from hierarchical DFT
Use bench-top ATPG bring-up to better understand and interact with silicon bring-up test data and reduce silicon bring-up cycle time….
By Steve Pateras, Mentor Graphics Ensuring safety and reliability of automotive ICs takes a full life-cycle view of automotive test…
Dr. Wally Rhines, the chairman and CEO of Mentor Graphics is one of the most dynamic and engaging speakers in…
