Latest posts

Optimizing DFT efficiency: Essential guidelines for SSN Bus Width and EDT channels

For an SSN design, only the SSN bus data in, SSN bus data out, SSN bus clock, and the TAP…

Advantages Of Using Tessent Shell For LogicBist Built-in Self Test Implementation

Logic Built-In Self-Test (LogicBist/LBIST) is used in integrated circuit design to embed test circuitry directly within the chip itself. The…

Reduce Your Tessent MemoryBIST Simulation Debug Time

Modern technologies like AI, IoT and other smart systems need a large amount of data storage leading to an increase…

Introduction to Tessent Multi-Die

With the latest developments in electronic industry to support revolutionary complex systems such as Autonomous vehicles or AI products/chips system-in-package…

Diagnosis-Driven Yield Analysis

Tessent Diagnosis leverages failure data from manufacturing tests, scan test patterns, and design information to pinpoint and classify defects causing…

Diverse Ways To use Algorithms With Programmable Controllers in Tessent Memory BIST

As part of the Tessent Memory BIST solution, Siemens provides a library of test patterns or algorithms for testing your…

TESSENT SUPPORT NOTES

Tessent SSN and Data Packets

The Tessent Scan Streaming Network (SSN) is a powerful tool that facilitates efficient testing of integrated circuits (ICs) by optimizing…

Navigating Tessent OCCs and Beyond: A Comprehensive Guide to On-Chip Clock Controllers

In today’s rapidly evolving semiconductor landscape, ensuring the robustness and reliability of integrated circuits is paramount. Embedded within these circuits…