The bring-up process of integrated circuits (ICs) involves several iterations through multiple steps spanning design, DFT (Design for Test), and…
Did you ever wonder how to make something good out of something bad? Of course, you have! I’m sure after…
“Now where did I put my keys?” It doesn’t have to be keys. It could be glasses, cell phone, purse,…
Finding manufacturing defects in integrated circuit (IC) chips is hard to do. Automatic test pattern generation (ATPG) and on-chip compression…
