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EDT Test Points

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

September 6, 2016

By Rick Fisette, Mentor Graphics Remove ATPG from the critical path to tapeout with hierarchical DFT plus test pattern retargeting…

By Tessent Solutions
4 MIN READ
Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

Ensure defect-free automotive ICs with the Hybrid TK/LBIST solution that also finds faults in the DFT logic

May 31, 2016

By Rahul Singhal, Mentor Graphics Near-zero defect testing for safety-critical ICs means also testing the DFT logic.

By Tessent Solutions
3 MIN READ
Take scan test out of the critical path

Take scan test out of the critical path

April 25, 2016

By Ron Press, Mentor Graphics DFT with less risk to your design flow? Here’s how.  

By Tessent Solutions
4 MIN READ
Addressing Moore’s Law with the First Law of Real Estate: Location, location, location

Addressing Moore’s Law with the First Law of Real Estate: Location, location, location

December 16, 2015

By Beth Martin with Steve Pateras, Mentor Graphics Mentor’s novel EDT test point technology dramatically reduces ATPG pattern volume

By Tessent Solutions
4 MIN READ
Test Points are Trending

Test Points are Trending

October 14, 2015

By Ron Press, Mentor Graphics Mentor’s EDT test points slash pattern count, test time and cost. But how about at-speed…

By Tessent Solutions
5 MIN READ
Using EDT Test Points to reduce test time and cost

Using EDT Test Points to reduce test time and cost

September 24, 2015

By Vidya Neerkundar, Mentor Graphics New EDT Test Points are the next big thing in ATPG test compression

By Tessent Solutions
6 MIN READ