Self-testing in embedded systems article – part 2

My latest article in embedded.com is the second instalment of a two-part piece:

Self-testing in embedded systems

All electronic systems carry the possibility of failure. An embedded system has intrinsic intelligence that facilitates the possibility of predicting failure and mitigating its effects. This article reviews the options for self-testing that are open to the embedded software developer, along with testing algorithms for memory and some ideas for self-monitoring software in multi-tasking and multi-CPU systems.

This second and concluding part concentrates on dealing with software failure.