In the rapidly evolving field of semiconductor testing, the ability to adapt and optimize test strategies is crucial for achieving…
A tap controller, or Test Access Port (TAP) controller, is a critical component in the design-for-test (DFT) methodology used in…
ATPG’s goal is to create a set of patterns that achieves a given test coverage, where test coverage is the…
For an SSN design, only the SSN bus data in, SSN bus data out, SSN bus clock, and the TAP…
With the latest developments in the electronic industry, supporting revolutionary complex systems such as Autonomous vehicles or AI products/chips system-in-package…
Tessent Diagnosis leverages failure data from manufacturing tests, scan test patterns, and design information to pinpoint and classify defects causing…
In today’s rapidly evolving semiconductor landscape, ensuring the robustness and reliability of integrated circuits is paramount. Embedded within these circuits…
