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Cell-Aware Test

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Tessent scan diagnosis at IPFA

September 14, 2021

IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021) is a virtual event this year,…

By Tessent Solutions
3 MIN READ

DFT and the competitive edge

October 13, 2020

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of glory. This one will be…

By Tessent Solutions
4 MIN READ
Transistor-Level Defect Diagnosis

Transistor-Level Defect Diagnosis

January 30, 2017

By Geir Eide, Mentor Graphics Need to diagnose silicon failures faster and with more accuracy? Try the new cell-aware diagnosis…

By Tessent Solutions
4 MIN READ
Cell-aware test can be “Awarding”

Cell-aware test can be “Awarding”

December 2, 2015

By Ron Press, Mentor Graphics Inventing Cell-aware ATPG earned Mentor’s Friedrich Hapke the 2015 Bob Madge Innovation Award.

By Tessent Solutions
6 MIN READ