2016 JT Open International Conference – Overview & Materials – Day 2

By MLoeffler

If you attended the JT Open Int’l. Conference, please consider taking 5 minutes to participate in a survey and let us know your feedback. This will help us to make future JT Open International conferences a success as well.

2016 JT Open Theme Graphic_FINAL.png

The 2016 JT Open International Conference took place from September 6-8, 2016 in Seattle, WA and was a must-attend event for all JT Open Program members and anyone interested in JT technology.

The conference brought together industry experts and technology practitioners to discuss how leaders are leveraging JT technology to build successful global PLM programs. An exciting agenda featured industry experts, researchers from academia, technologists, and developers of technology standards.

The conference theme of “The Open Road” highlighted the spirit of innovation and adventure that has driven JT developments from the beginning, and will continue into the future.

Keynote and session speakers for Day 2 included:

  • George Allen, Key Expert At Siemens PLM Software

  • Experts from the 3MF Consortium, Bentley Systems, CT CoreTechnologie, Elysium,FCA, Ford, ITI, Microsoft, Theorem Solutions, Vcollab, Siemens, and others.


2 thoughts about “2016 JT Open International Conference – Overview & Materials – Day 2
  • Thanks for the information recently I bought an iPhone and I want to install this application whereas tried this but its shows me an error message, Regarding this problem I talked to the Apple Application Support for the solution but I am still facing a problem.

  • Dear Teleworm12,

    thank you for your comment. Could you please specify what you are trying to download/install on your phone? The files in the blog post above are PDF files, so you should be able to view them with a PDF viewer.


    However if you are trying to download the iPhone version of the JT2Go Viewer you can find it under this link


    Please let us know if this solves your problems.


    Thank you.

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This article first appeared on the Siemens Digital Industries Software blog at