How NXP Achieved Robust Verification and Portfolio Re-characterization of Liberty IP with Solido Characterization Suite

At the Design Automation Conference (DAC), Siemens EDA and NXP collaborated to showcase innovative methodologies that directly address two of the most critical challenges in library characterization: accelerating Liberty (.lib) characterization and verification. Together, we presented solutions that redefine traditional approaches, creating efficient and reliable workflows that advance NXP’s design process.

Reflections from Siemens EDA User2User Forum in Noida

I recently had the privilege of representing the Solido Custom IC (CIC) team at the Siemens EDA User2User Forum 2025…

Transform Your IP Selection Process with Solido Library Profiler

At the heart of every breakthrough technology lies intellectual property (IP), powering everything from cutting-edge System-on-Chips (SoCs) to specialized Application-Specific…

Production-grade AI, and how it is changing the way we approach semiconductor design and verification

Production-grade AI, and how it is changing the way we approach semiconductor design and verification

As reported in NVIDIA’s highly-anticipated earnings call last week, the AI revolution continues to fuel tremendous growth in semiconductors. In…

How AI-powered EDA solutions help design and verify library IP for SoCs

Note: If you’re interested in knowing more about the Solido Library IP Solution, check out our on-demand webinar about optimizing…

Discussing Custom IC Verification with Taiwan Semiconductor Community

Taiwan is an inspiration to many countries that aspire to build or expand their semiconductor ecosystem. Although a small nation,…

Don’t Skip Steps: The Significance of Qualifying IP Revisions

Have you ever written a Master’s thesis, a paper for a science class, or even an article for a school…