{"id":6304,"date":"2012-06-28T09:18:05","date_gmt":"2012-06-28T16:18:05","guid":{"rendered":"https:\/\/blogs.mentor.com\/verificationhorizons\/?p=6304"},"modified":"2026-03-27T08:34:31","modified_gmt":"2026-03-27T12:34:31","slug":"intelligent-testbench-automation-catching-on-fast","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/2012\/06\/28\/intelligent-testbench-automation-catching-on-fast\/","title":{"rendered":"Intelligent Testbench Automation – Catching on Fast"},"content":{"rendered":"

Graph-Based Intelligent Testbench Automation
\n<\/strong>While intelligent testbench automation<\/a> is still reasonably new when measured in EDA years, this graph-based verification technology is being adopted by more and more verification teams every day.\u00a0 And the interest is global.\u00a0 Verification teams from Europe, North America, and the Pacific Rim are now using iTBA to help them verify their newest electronic designs in less time and with fewer resources.\u00a0 (If you haven’t adopted it yet, your competitors probably have.)\u00a0 If you have yet to learn how this new technology can help you achieve higher levels of verification, despite increasing design complexity, I’d suggest you check out a recent article in the June 2012 issue of Verification Horizons<\/a> titled “Is Intelligent Testbench Automation For You<\/a>?”\u00a0 The article focuses on where iTBA is best applied and where it will help you most by producing optimal results, and how design applications with a large verification space, functionally oriented coverage goals, and unbalanced conditions can often experience a 100X gain in coverage closure acceleration.\u00a0 For more detail about these and other considerations, you’ll have to read the article.<\/strong><\/p>\n

Fitzpatrick’s Corollary
\n<\/strong>And while you’re there, you might also notice that the entire June 2012 issue of Verification Horizons<\/a> is devoted to helping you achieve the highest levels of coverage as efficiently as possible.\u00a0 Editor and fellow verification technologist Tom Fitzpatrick<\/a> succinctly adapts Murphy’s Law to verification, writing “If It Isn’t Covered, It Doesn’t Work”.\u00a0\u00a0 And any experienced verification engineer (or manager) knows just how true this is, making it critical that we thoughtfully prioritize our verification goals, and achieve them as quickly and efficiently as possible.\u00a0 The June 2012 issue offers nine high quality articles, with a particular focus on coverage.<\/strong><\/p>\n

Berg’s Proof
\n<\/strong>Another proof that iTBA is catching on globally, is the upcoming TVS DVClub event<\/a> being held next Monday 2 July 2012, in Bristol, Cambridge, and Grenoble.\u00a0 The title of the event is “Graph-Based Verification”, and three industry experts will discuss different ways you can take advantage of what graph-based intelligent testbench automation has to offer.\u00a0 My colleague and fellow verification technologist Staffan Berg<\/a> leads off the event with a proof of his own, as he will present how graph-based iTBA can significantly shorten your time-to-coverage.\u00a0 Staffan will show you how to use graph-based verification to define your stimulus space and coverage goals, by highlighting examples from some of the verification teams that have already adopted this technology, as I mentioned above.\u00a0 He’ll also show how you can introduce iTBA into your existing verification environment, so you can realize these benefits without disrupting your existing process.\u00a0 I have already registered and plan to attend the TVS DVClub event<\/a>, but I’ll have to do some adapting of my own as the event runs from 11:30am to 2:00pm BST in the UK.\u00a0 But I’ve seen Staffan present before, and both he and intelligent testbench automation<\/a> are worth getting up early for.\u00a0 Hope to see you there, remotely speaking.<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":"

Graph-Based Intelligent Testbench Automation While intelligent testbench automation is still reasonably new when measured in EDA years, this graph-based verification…<\/p>\n","protected":false},"author":71600,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[506,551,562,758,787,819,820],"industry":[],"product":[],"coauthors":[],"class_list":["post-6304","post","type-post","status-publish","format-standard","hentry","category-news","tag-functional-verification","tag-intelligent-testbench-automation","tag-itba","tag-testbench","tag-uvm","tag-verification","tag-verification-academy"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/6304","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/users\/71600"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/comments?post=6304"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/6304\/revisions"}],"predecessor-version":[{"id":19745,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/6304\/revisions\/19745"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/media?parent=6304"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/categories?post=6304"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/tags?post=6304"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/industry?post=6304"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/product?post=6304"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/coauthors?post=6304"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}