{"id":5728,"date":"2012-01-16T08:00:06","date_gmt":"2012-01-16T15:00:06","guid":{"rendered":"https:\/\/blogs.mentor.com\/verificationhorizons\/?p=5728"},"modified":"2026-03-27T08:43:56","modified_gmt":"2026-03-27T12:43:56","slug":"systemc-2011-standard-published","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/2012\/01\/16\/systemc-2011-standard-published\/","title":{"rendered":"SystemC 2011 Standard Published"},"content":{"rendered":"<h3>IEEE Std. 1666\u2122-2011 Available as Free Download<\/h3>\n<p>In November 2011 I <a href=\"https:\/\/blogs.mentor.com\/verificationhorizons\/blog\/2011\/11\/10\/tlm-becomes-an-ieee-standard\/\" target=\"_blank\" rel=\"noopener\">blogged<\/a> the IEEE Standards Association (SA) approved a revision to the popular SystemC standard, known officially as IEEE Std. 1666\u2122-2011.\u00a0 One of the key elements of this standard includes the addition of Transaction Level Modeling (TLM).\u00a0 I pointed to several online resources to learn more about the revised SystemC standard in that blog.\u00a0 But missing from the list of resources was information on how to get the revised standard from the IEEE.\u00a0 As I concluded my blog, I indicated that the final editorial review and formatting for publication was underway and that I would report back when this work was completed.<\/p>\n<p><a href=\"http:\/\/standards.ieee.org\/getieee\/1666\/download\/1666-2011.pdf\" target=\"_blank\" rel=\"noopener\"><img loading=\"lazy\" decoding=\"async\" style=\"padding-left: 0px;padding-right: 0px;float: right;padding-top: 0px;border-width: 0px\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2012\/01\/IEEE-Std-1666-2011.jpg\" alt=\"IEEE Std 1666-2011\" width=\"193\" height=\"246\" align=\"right\" border=\"0\" \/><\/a>I can report that the IEEE SA concluded their editing of the specification and it is now ready for download.\u00a0 Many of you know the prior version of the SystemC standard was available for free download and have wondered if this would be the same for this revision update.\u00a0 The good news is the revision update is available as a free download as well.\u00a0 If you wish to have a printed and bound copy, that too is available, but that will have to be purchased.<\/p>\n<p>IEEE Std. 1666-2011 is part of the \u201c<a href=\"http:\/\/standards.ieee.org\/getieee\/1666\/download\/1666-2011.pdf\" target=\"_blank\" rel=\"noopener\">IEEE Get Program<\/a>\u201d that offers individuals the ability to retrieve, download and print one copy of the standard for free.\u00a0 Click on the link above to get your personal copy of the standard.\u00a0 You will need to share some basic information with the IEEE on your user type (Academic, System\/Semiconductor Company,\u00a0 EDA Company, IP Company or Other).\u00a0 This is certainly worth if for a free copy.<\/p>\n<p>The original standard, IEEE Std. 1666\u2122-2005, had more than 50,000 free downloads since it was made available and I expect this version to do even better.\u00a0 With the addition of TLM to the standard and the move up in abstraction to handle system design requirements, the need for this standard is even more pressing today.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>IEEE Std. 1666\u2122-2011 Available as Free Download In November 2011 I blogged the IEEE Standards Association (SA) approved a revision&#8230;<\/p>\n","protected":false},"author":71541,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[310,311,528,732,749,764],"industry":[],"product":[],"coauthors":[],"class_list":["post-5728","post","type-post","status-publish","format-standard","hentry","category-news","tag-1666-2005","tag-1666-2011","tag-ieee","tag-standards","tag-systemc","tag-tlm"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/5728","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/users\/71541"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/comments?post=5728"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/5728\/revisions"}],"predecessor-version":[{"id":14629,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/5728\/revisions\/14629"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/media?parent=5728"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/categories?post=5728"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/tags?post=5728"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/industry?post=5728"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/product?post=5728"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/coauthors?post=5728"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}