{"id":18488,"date":"2023-12-12T11:38:19","date_gmt":"2023-12-12T16:38:19","guid":{"rendered":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/?p=18488"},"modified":"2026-03-27T08:52:04","modified_gmt":"2026-03-27T12:52:04","slug":"ieee-honors-siemens-employees-for-dedication-to-standards-development","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/2023\/12\/12\/ieee-honors-siemens-employees-for-dedication-to-standards-development\/","title":{"rendered":"IEEE Honors Siemens Employees for Dedication to Standards Development"},"content":{"rendered":"\n<p>Annually, the IEEE Standards Association (IEEE SA) recognizes outstanding participation across a variety of technical areas of standards development, leadership, and distinguished service.&nbsp; The <a href=\"https:\/\/standards.ieee.org\/about\/awards\/\" target=\"_blank\" rel=\"noopener\">IEEE SA awards ceremony<\/a> was held in early December and among the awardees are two from Siemens EDA.  You may recognize the names as they are two of our Verification Horizons bloggers as well.  <\/p>\n\n\n\n<p><strong>Dave Rich<\/strong> \u2013 <a href=\"https:\/\/sagroups.ieee.org\/dasc\/home\/the-ron-waxman-award\/\" target=\"_blank\" rel=\"noopener\">The Ron Waxman Design Automation Standards Committee Meritorious Service Award<\/a>, given in recognition of outstanding service exemplifying the spirit of the DASC.&nbsp;<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"534\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dave-1024x534.jpg\" alt=\"\" class=\"wp-image-18489\" srcset=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dave-1024x534.jpg 1024w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dave-600x313.jpg 600w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dave-768x401.jpg 768w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dave-900x470.jpg 900w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dave.jpg 1035w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><figcaption class=\"wp-element-caption\">Dave Rich Accepting Award &#8211; Pictured (left to right): Dennis Brophy, DASC Chair; Ron Waxman, DASC Founder; Dave Rich; Yatin Trivedi, IEEE SA Awards Committee Chair<\/figcaption><\/figure><\/div>\n\n\n<p>Dave was recognized for more than three decades of design and verification experience in simulation and synthesis technologies.&nbsp; Affectionately known as &#8220;Mr. SystemVerilog,&#8221; he has been actively involved in SystemVerilog standardization for many years, and served as the Technical Chair of the IEEE P1800 Working Group for the soon-to-be-published 1800-2023 Standard. Dave also serves on the Steering Committee for the Design and Verification Conference (DVConUS).&nbsp;<\/p>\n\n\n\n<p><strong>Dennis Brophy <\/strong>\u2013 The IEEE-SA <a href=\"https:\/\/standards.ieee.org\/about\/awards\/intl\/\" target=\"_blank\" rel=\"noopener\">International Award<\/a>, given in recognition of his global efforts to drive definition, acceptance, and use of electronic design automation standards including IEEE 1076 (VHDL), IEEE 1666 (SystemC), and IEEE 1800 (SystemVerilog).  <\/p>\n\n\n\n<figure class=\"wp-block-image size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"1006\" height=\"603\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dennis.jpg\" alt=\"\" class=\"wp-image-18491\" srcset=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dennis.jpg 1006w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dennis-600x360.jpg 600w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dennis-768x460.jpg 768w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Dennis-900x539.jpg 900w\" sizes=\"auto, (max-width: 1006px) 100vw, 1006px\" \/><figcaption class=\"wp-element-caption\">Dennis Brophy Accepting Award &#8211; Pictured: James Mathews, IEEE SA President; Dennis Brophy; Yatin Trivedi, IEEE SA Awards Committee Chair<\/figcaption><\/figure>\n\n\n\n<p>Dennis was recognized for his contributions to advance the international goals of the IEEE SA from his early work in VHDL to fostering a global market in the adoption of SystemVerilog. &nbsp;His work has aligned IEEE and IEC standardization for electronic design automation.&nbsp; He has further worked to bring the interests of industry globally into the standardization process to deliver market relevant standards.&nbsp;<\/p>\n\n\n\n<p>The IEEE honored two others in electronic design automation. &nbsp;The Ron Waxman DASC Meritorious Service award was presented to an entity, JEITA SSS-TC (Japan Electronics and Information Technology Industries Association, Semiconductor System Solution Technical Committee) for development of IEEE Std. 2401 and the group&#8217;s longstanding support of the development and adoption of EDA-related language-based standards.&nbsp; The award was accepted by <a href=\"https:\/\/standards.ieee.org\/wp-content\/uploads\/2023\/12\/IEEE_SA_2023-177.jpg\" target=\"_blank\" rel=\"noopener\">Geni\u2019chi Tanaka<\/a>.&nbsp; The IEEE SA Standards Medallion was awarded to <a href=\"https:\/\/standards.ieee.org\/wp-content\/uploads\/2023\/12\/IEEE_SA_2023-155.jpg\" target=\"_blank\" rel=\"noopener\">Jyotika Athavale<\/a> for leadership, technical expertise, and guidance in the development of IEEE Std. 2851 in functional safety.&nbsp;<\/p>\n\n\n\n<p>Standards make all our lives simpler, promote interoperability and fuel product compatibility.  I&#8217;m pleased to see two of my Siemens colleagues being recognized this year as standards provide a stable but continually evolving foundation that enables entire industries to develop and thrive.    <\/p>\n","protected":false},"excerpt":{"rendered":"<p>Annually, the IEEE Standards Association (IEEE SA) recognizes outstanding participation across a variety of technical areas of standards development, leadership,&#8230;<\/p>\n","protected":false},"author":71936,"featured_media":18494,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1,2],"tags":[732,751],"industry":[1564,53],"product":[205,206],"coauthors":[946],"class_list":["post-18488","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","category-corporate","tag-standards","tag-systemverilog","industry-electronic-design-automation","industry-electronics-semiconductors","product-questa","product-questa-verification-ip"],"featured_image_url":"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2023\/12\/IEEE_SA_2023-Intl-Award.jpg","_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/18488","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/users\/71936"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/comments?post=18488"}],"version-history":[{"count":5,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/18488\/revisions"}],"predecessor-version":[{"id":18726,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/18488\/revisions\/18726"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/media\/18494"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/media?parent=18488"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/categories?post=18488"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/tags?post=18488"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/industry?post=18488"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/product?post=18488"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/coauthors?post=18488"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}