{"id":13070,"date":"2018-03-27T09:39:33","date_gmt":"2018-03-27T16:39:33","guid":{"rendered":"https:\/\/blogs.mentor.com\/verificationhorizons\/?p=13070"},"modified":"2026-03-27T08:38:42","modified_gmt":"2026-03-27T12:38:42","slug":"dvcon-china-2018-driving-the-next-big-wave-in-verification","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/2018\/03\/27\/dvcon-china-2018-driving-the-next-big-wave-in-verification\/","title":{"rendered":"DVCon China 2018: Driving the Next Big Wave in Verification!"},"content":{"rendered":"<p>DVCon is recognized as the premiere industry-focused functional design and verification conference. In fact, today DVCon has grown from a single US regional event located in Silicon Valley into a conference series of global events that have recently occurred in China, Europe, India, and Japan.<\/p>\n<p><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-13072 aligncenter\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/54\/2018\/03\/dvcon-logo-2018.png\" alt=\"\" width=\"352\" height=\"217\" \/><\/p>\n<p>After the first very successful DVCon China event in 2017, I am excited to say that DVCon will return to Shanghai on Tuesday April 18<sup>th<\/sup>. And this year\u2019s DVCon China has a packed agenda, consisting of: three workshops, four tutorials, a poster session, and five regular sessions where multiple technical papers will be presented. In addition, there will be three keynotes.<\/p>\n<p>At last year\u2019s DVCon China, Dr. Wally Rhines, President and CEO of Mentor, a Siemens Business, gave an inspiring keynote on the state of verification from a worldwide perspective. Dr. Rhines presented data that supports the argument that China is one of the leaders in adopting advanced functional verification techniques. For this year\u2019s DVCon China, I am honored to be one of the invited keynote speakers. My talk builds on Dr. Rhines keynote from last year, where I will share recent macro trends that are affecting the global microelectronics industry, and the impact these trends are having on the future of functional design and verification.<\/p>\n<p>I have titled my talk <em>The Next Big Thing in Design Driving the Next Big Wave in Verification<\/em>. The inspiration for this talk centers on the amazing innovations our industry has recently experienced with respect to computing, networking, and communications. These include the changing nature of computing, the dramatic changes in networking and storage, and the disruptive effect of new broadband communications. Yet, the next big wave in design is actually the convergence of these technologies, which is driving today\u2019s internet-of-things and autonomous systems revolution. A common theme across these emerging systems is the need for low power, security, and safety\u2014whether you are talking about devices on the edge or high-availability systems in the cloud. These new challenges have opened innovation opportunities for us to rethink the way we approach both design and verification.<\/p>\n<p>I hope my talk inspires you and I look forward to meeting you at <a href=\"https:\/\/dvcon-china.org\/\" target=\"_blank\" rel=\"noopener\">DVCon China 2018<\/a>!<\/p>\n","protected":false},"excerpt":{"rendered":"<p>DVCon is recognized as the premiere industry-focused functional design and verification conference. In fact, today DVCon has grown from a&#8230;<\/p>\n","protected":false},"author":71592,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[442,447,493,506,641,751,787],"industry":[],"product":[],"coauthors":[],"class_list":["post-13070","post","type-post","status-publish","format-standard","hentry","category-news","tag-dvcon","tag-dvcon-shanghai","tag-formal-verification","tag-functional-verification","tag-portable-test-and-stimulus-standard","tag-systemverilog","tag-uvm"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/13070","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/users\/71592"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/comments?post=13070"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/13070\/revisions"}],"predecessor-version":[{"id":19856,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/13070\/revisions\/19856"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/media?parent=13070"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/categories?post=13070"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/tags?post=13070"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/industry?post=13070"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/product?post=13070"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/coauthors?post=13070"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}