{"id":12645,"date":"2016-12-15T15:51:27","date_gmt":"2016-12-15T22:51:27","guid":{"rendered":"https:\/\/blogs.mentor.com\/verificationhorizons\/?p=12645"},"modified":"2026-03-27T08:42:33","modified_gmt":"2026-03-27T12:42:33","slug":"dvcon-u-s-2017-bigger-and-better","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/2016\/12\/15\/dvcon-u-s-2017-bigger-and-better\/","title":{"rendered":"DVCon U.S. 2017: Bigger and Better!"},"content":{"rendered":"<h3><a href=\"https:\/\/dvcon.org\/\" target=\"_blank\" rel=\"noopener\"><img loading=\"lazy\" decoding=\"async\" class=\"\" style=\"margin: 0px 0px 0px 7px;float: right\" src=\"https:\/\/dvcon.org\/sites\/dvcon.org\/files\/2017DVConUS_logo.png\" width=\"329\" height=\"199\" align=\"right\" \/><\/a>Technical Program is Live<\/h3>\n<p>For the past several months, the DVCon U.S. <a href=\"https:\/\/dvcon.org\/about\/committees\/steering\" target=\"_blank\" rel=\"noopener\"><strong>Steering Committee<\/strong><\/a> has been meeting to craft a compelling event of technical papers, panels, keynotes, poster sessions and more for you.\u00a0 With the hard work of authors who supply this content and the <a href=\"https:\/\/dvcon.org\/about\/committees\/technical-program\" target=\"_blank\" rel=\"noopener\"><strong>Technical Program Committee<\/strong><\/a> that reviews and selects from this content, a 4-day event schedule is now published.\u00a0 You can find the event schedule <a href=\"https:\/\/dvcon.org\/agenda\" target=\"_blank\" rel=\"noopener\"><strong>here<\/strong><\/a>.<\/p>\n<p>I am pleased to chair DVCon U.S. 2017 and work with such an august body of people \u2013 from the electronic design automation industry, design and verification practitioners and professionals from large systems houses to small consultancies \u2013 all who work hard for you to make this happen.\u00a0 As has been the tradition of DVCon U.S. the past several years, the event starts with Accellera Day on Monday (Feb 27th) followed by two days of paper presentations, keynotes, panels and an exhibition.\u00a0 The exhibition starts Monday, Accellera Day.\u00a0 The last day of DVCon U.S. features a full day of tutorials split in to half-day parts.<\/p>\n<h3>Accellera Day<\/h3>\n<p>DVCon U.S. will feature something for advanced users and those who may be more novice.\u00a0 The conference will showcase emerging standards and updates to those standards well used.\u00a0 On Monday, Accellera Day, DVCon U.S. begins with a tutorial devoted to work underway within Accellera on a new standard, \u201cPortable Stimulus,\u201d that is set to give design and verification engineers a boost in overall design and verification productivity.\u00a0 Given the work by the Accellera <a href=\"http:\/\/www.accellera.org\/activities\/working-groups\/portable-stimulus\/\" target=\"_blank\" rel=\"noopener\"><strong>Portable Stimulus Working Group<\/strong><\/a> to put as much of the standard in place that it can, this tutorial, <em><a href=\"https:\/\/dvcon.org\/content\/event-details?id=222-1-T\" target=\"_blank\" rel=\"noopener\"><strong>Creating Portable Stimulus Models with the Upcoming Accellera Standard<\/strong><\/a><\/em>, is sure to be an important educational opportunity.\u00a0 If you are a user of UVM (Universal Verification Methodology) you will find the Portable Stimulus standard is set to remove many of the limitations of reuse at the subsystem and full-chip level and address the lack of portability across execution platforms.\u00a0 Are you ready for Portable Stimulus?\u00a0 You will be ready after attending this tutorial.<\/p>\n<p>As the Monday luncheon evolves, I anticipate a moderated panel discussion hosted by Accellera on the emerging Portable Stimulus standard based on what you learned in the morning session.\u00a0 As lunch ends, two parallel tutorials will start, one on IEEE P1800.2\u2122 (aka UVM) and the other on System C design and verification advances.\u00a0 Accellera Day is a great event to learn about the latest in the evolution of standards coming from Accellera and the IEEE.<\/p>\n<h3>Special Session<\/h3>\n<p>DVCon U.S. will make one departure from prior years\u2019 programs and offer a special session on Tuesday on <a href=\"https:\/\/dvcon.org\/content\/event-details?id=222-50\" target=\"_blank\" rel=\"noopener\"><strong>Trends in Functional Verification: A 2016 Industry Study<\/strong><\/a> presented by Harry Foster.\u00a0 Harry has been reporting on the <a href=\"https:\/\/blogs.mentor.com\/verificationhorizons\/blog\/2016\/12\/02\/part-12-the-2016-wilson-research-group-functional-verification-study\/\" target=\"_blank\" rel=\"noopener\"><strong>2016 Wilson Research Group Study<\/strong><\/a> here at the <a href=\"https:\/\/blogs.mentor.com\/verificationhorizons\/\" target=\"_blank\" rel=\"noopener\"><strong>Verification Horizon\u2019s BLOG<\/strong><\/a>, and he has shared regional information at DVCon Europe and DVCon India on adoption and use of design and verification tools, technology and standards.\u00a0 At DVCon U.S. he will pull all this together to show trends and offer predictions for the future.<\/p>\n<p>There is much more to DVCon U.S. 2017 that I think you will find useful.\u00a0 I leave it to you to explore the <strong><a href=\"https:\/\/dvcon.org\/agenda\" target=\"_blank\" rel=\"noopener\">program <\/a><\/strong>more to discover this for yourself.\u00a0 And if you can make it to DVCon U.S., <a href=\"https:\/\/dvcon.org\/rates\" target=\"_blank\" rel=\"noopener\"><strong>registration<\/strong><\/a> is also open with advanced rates available until January 26th.\u00a0 I hope to see you there!<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Technical Program is Live For the past several months, the DVCon U.S. Steering Committee has been meeting to craft a&#8230;<\/p>\n","protected":false},"author":71541,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[326,442,528,638,732,749,787,852],"industry":[],"product":[],"coauthors":[],"class_list":["post-12645","post","type-post","status-publish","format-standard","hentry","category-news","tag-accellera","tag-dvcon","tag-ieee","tag-portable-stimulus","tag-standards","tag-systemc","tag-uvm","tag-wilson-research-group-study"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/12645","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/users\/71541"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/comments?post=12645"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/12645\/revisions"}],"predecessor-version":[{"id":14582,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/posts\/12645\/revisions\/14582"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/media?parent=12645"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/categories?post=12645"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/tags?post=12645"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/industry?post=12645"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/product?post=12645"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/verificationhorizons\/wp-json\/wp\/v2\/coauthors?post=12645"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}