{"id":962,"date":"2022-07-11T11:12:29","date_gmt":"2022-07-11T15:12:29","guid":{"rendered":"https:\/\/blogs.sw.siemens.com\/valor\/?p=962"},"modified":"2026-03-26T13:32:48","modified_gmt":"2026-03-26T17:32:48","slug":"reduce-recalls-by-using-visual-data-and-ai-to-detect-defective-parts","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/valor\/2022\/07\/11\/reduce-recalls-by-using-visual-data-and-ai-to-detect-defective-parts\/","title":{"rendered":"Reduce recalls by using visual data and AI to detect defective parts"},"content":{"rendered":"\n<h2 class=\"wp-block-heading\">Webinar on-demand: The power of AI and big data\u2014how visual data enables surgical traceability<\/h2>\n\n\n\n<p>Defective and counterfeit parts, and other component faults such as parts that are recycled, tampered with, damaged, or expired, are known to cause 8 in 10 product failures and significantly raise the risk of recalls.<\/p>\n\n\n\n<p>This is a huge problem, particularly in today\u2019s market, since major <a href=\"https:\/\/blogs.sw.siemens.com\/valor\/2022\/01\/24\/electronics-manufacturing-industry-trends-in-2022\/\" target=\"_blank\" rel=\"noreferrer noopener\">shortages in the component supply chain<\/a> are forcing manufacturers to work outside of their trusted supplier network and are exposing them to significant risk of component faults. Existing traceability solutions don\u2019t provide sufficient component-level protection since they only test small samples and can\u2019t identify problems in individual components in a mixed batch. That\u2019s why now, more than ever, electronics manufacturers need a component inspection solution that can provide visual verification of every component before it is placed on a PCB.<\/p>\n\n\n\n<p>Siemens partner <a href=\"https:\/\/www.cybord.ai\/\" target=\"_blank\" rel=\"noreferrer noopener\">Cybord<\/a>\u2014a startup that helps electronics manufacturers improve product reliability and material sourcing\u2014has tackled the problem by developing a first-of-its kind solution that enables visual inspection of 100% of the components on a PCB. The SaaS solution utilizes existing images taken by SMT assembly machines and pairs them with proprietary AI to determine whether each and every component is authentic and in good condition in real time. Since it is a SaaS solution and utilizes existing images, no additional hardware is required and there is no impact on speed. It enables surgical traceability of defective parts and counterfeit components, allowing manufacturers to minimize costly recalls.<\/p>\n\n\n\n<p>Watch the <a href=\"https:\/\/webinars.sw.siemens.com\/en-US\/data-visualization-and-ai-quality-control-to-detect-defective-parts\/\" data-type=\"URL\" data-id=\"https:\/\/webinars.sw.siemens.com\/en-US\/data-visualization-and-ai-quality-control-to-detect-defective-parts\/\" target=\"_blank\" rel=\"noreferrer noopener\">joint Siemens webinar with Cybord<\/a> to learn more about this new method to secure the electronic component supply, as well as mitigate risk and secure traceability using the latest technology.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Webinar on-demand: The power of AI and big data\u2014how visual data enables surgical traceability Defective and counterfeit parts, and other&#8230;<\/p>\n","protected":false},"author":69581,"featured_media":965,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1,39],"tags":[57,54,58],"industry":[357,358,356],"product":[],"coauthors":[381],"class_list":["post-962","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","category-events","tag-electronics-manufacturing","tag-material-management","tag-pcb-assembly","industry-consumer-industrial-electronics","industry-electronic-manufacturing-services","industry-electronics-semiconductors"],"featured_image_url":"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/22\/2022\/07\/PCB-component-reel-scanning-scaled.jpg","_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/posts\/962","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/users\/69581"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/comments?post=962"}],"version-history":[{"count":3,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/posts\/962\/revisions"}],"predecessor-version":[{"id":1095,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/posts\/962\/revisions\/1095"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/media\/965"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/media?parent=962"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/categories?post=962"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/tags?post=962"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/industry?post=962"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/product?post=962"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/valor\/wp-json\/wp\/v2\/coauthors?post=962"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}