{"id":880,"date":"2020-06-22T14:37:05","date_gmt":"2020-06-22T21:37:05","guid":{"rendered":"http:\/\/blogs.mentor.com\/tessent\/?p=880"},"modified":"2026-03-26T16:05:56","modified_gmt":"2026-03-26T20:05:56","slug":"dft-productivity-web-seminar-faster-debug-with-tessent-visualizer","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/tessent\/2020\/06\/22\/dft-productivity-web-seminar-faster-debug-with-tessent-visualizer\/","title":{"rendered":"DFT productivity web seminar: Faster debug with Tessent Visualizer"},"content":{"rendered":"<p><em>Learn how to take your DFT debug to the next level! <\/em><\/p>\n<p><!--more--><\/p>\n<p><a href=\"http:\/\/blogs.mentor.com\/tessent\/blog\/2020\/06\/22\/dft-productivity-web-seminar-faster-debug-with-tessent-visualizer\/image-9\/\" rel=\"attachment wp-att-882 noopener\" target=\"_blank\"><img loading=\"lazy\" decoding=\"async\" class=\"alignright size-medium wp-image-882\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/48\/2020\/06\/image-520x376.jpg\" alt=\"\" width=\"520\" height=\"376\" \/><\/a>The live, one-hour, online seminar <a href=\"https:\/\/www.mentor.com\/products\/silicon-yield\/events\/tessent-visualizer---increase-your-productivity-with-less-time-spent-on-dft-debug\/?cmpid=10595\" target=\"_blank\" rel=\"noopener noreferrer\">Tessent Visualizer &#8211; Increase your productivity with less time spent on DFT debug<\/a> is presented by Mentor expert Jay Jahangiri.<\/p>\n<p>When:<\/p>\n<ul>\n<li>June 30, 2020, at 5:00 PM US\/Pacific.<\/li>\n<li>July 1, 2020, at 8:00 AM US\/Pacific.<\/li>\n<\/ul>\n<p>If you can\u2019t make either of the live sessions, register anyway and you\u2019ll get the link to the recorded session afterward.<\/p>\n<p>Where: Live, online presentation, and Q&amp;A with the expert.<\/p>\n<p>Cost: An hour of your time.<\/p>\n<p>The seminar focuses on how to solve the challenges of the most time-consuming DFT debug tasks. Tessent Visualizer, included with Tessent products helps you find and trace to objects in large cones of logic &gt;100x faster than traditional tracing methods. You will learn how to use the intuitive schematic features and the powerful table-driven search engine to debug test coverage and DRC violations faster.<\/p>\n<p><a href=\"https:\/\/www.mentor.com\/products\/silicon-yield\/events\/tessent-visualizer---increase-your-productivity-with-less-time-spent-on-dft-debug\/?cmpid=10595\" target=\"_blank\" rel=\"noopener noreferrer\">Register now!<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Learn how to take your DFT debug to the next level!<\/p>\n","protected":false},"author":71644,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[],"industry":[],"product":[],"coauthors":[],"class_list":["post-880","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts\/880","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/users\/71644"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/comments?post=880"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts\/880\/revisions"}],"predecessor-version":[{"id":2400,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts\/880\/revisions\/2400"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/media?parent=880"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/categories?post=880"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/tags?post=880"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/industry?post=880"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/product?post=880"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/coauthors?post=880"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}