{"id":420,"date":"2017-05-17T10:13:12","date_gmt":"2017-05-17T17:13:12","guid":{"rendered":"http:\/\/blogs.mentor.com\/tessent\/?p=420"},"modified":"2026-03-26T16:04:17","modified_gmt":"2026-03-26T20:04:17","slug":"yasa-mentor-focus-at-the-european-test-symposium","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/tessent\/2017\/05\/17\/yasa-mentor-focus-at-the-european-test-symposium\/","title":{"rendered":"Yasa! Mentor Focus at the European Test Symposium"},"content":{"rendered":"

The IEEE European Test Symposium\u00a0<\/a> takes place from 22-16 May in Limassol, Cyprus. When not contemplating the stunning azure Mediterranean, be sure to catch up on what\u2019s new with Mentor\u2019s Tessent IC test and yield analysis solutions. Mentor\u2019s Tessent product line covers everything from test definition, test bring-up, silicon characterization, water test, package test, failure diagnosis and yield analysis for IC logic, memory, analog, and I\/O.<\/p>\n

At the Table-top Demo session, you can see how to use a simple benchtop system for silicon debug, characterization, and diagnosis. The benchtop debug system reduces overall test cost and time-to-market.<\/p>\n

Mentor will also give two presentations at the Vendor Sessions. The first is \u201cFull Throttle on Automotive Test,\u201d which describes Mentor\u2019s comprehensive set of targeted test solutions to meet ISO 26262 quality and reliability requirements. All Tessent solutions are part of the Mentor Safe program and are ISO 26262 certified for use on ASIL D designs.<\/p>\n

The second Vendor Session presentation is \u201cDFT Methodologies and IoT Trends,\u201d which clarifies the unique manufacturing test challenges of different market segments and how DFT methodologies will change for the fast-growing IoT sector.<\/p>\n

Panels<\/h3>\n

If AMS is your area of concern, you might want to go to the technical session titled \u201cA Publically-Accessible set of AMS Benchmark Circuits,\u201d by Stephen Sunter. Sunter is also moderating a panel session to discuss the most significant defects that we are not modeling or targeting adequately.<\/p>\n

If automotive ICs are more your thing, visit the concurrent panel on in-field self-test for automotive ICs. Mentor\u2019s Martin Keim and others will discuss the issues surrounding this growing market.<\/p>\n

The final panel of the symposium, \u201cIndustry Wish List,\u201d includes foundry, EDA, and semiconductor perspectives on the needs and wants of IC test.<\/p>\n

Technical Sessions and Tutorials<\/h3>\n