{"id":352,"date":"2017-02-07T09:30:32","date_gmt":"2017-02-07T16:30:32","guid":{"rendered":"http:\/\/blogs.mentor.com\/tessent\/?p=352"},"modified":"2026-03-26T16:04:03","modified_gmt":"2026-03-26T20:04:03","slug":"expose-transistor-level-yield-limiters-with-cell-aware-diagnosis","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/tessent\/2017\/02\/07\/expose-transistor-level-yield-limiters-with-cell-aware-diagnosis\/","title":{"rendered":"Expose Transistor-level Yield Limiters with Cell-aware Diagnosis"},"content":{"rendered":"<p><em>Improve yield and failure analysis by identifying defects inside standard cells. Learn more in this new whitepaper.<\/em><\/p>\n<p><!--more--><\/p>\n<p>&nbsp;<\/p>\n<p>Cell-aware diagnosis is a new and effective method to perform transistor-level diagnosis to identify defects inside standard cells. It leverages fault models derived from analog simulation and uses a fail data collection and diagnosis flow identical to that of traditional diagnosis. Cell-aware diagnosis in Tessent\u00ae Diagnosis is the result of over 10 years of research in cell-aware test and was developed in collaboration with fabless semiconductor manufacturers, foundries, and integrated device manufacturers.<\/p>\n<p>Read more in this <a href=\"https:\/\/www.mentor.com\/products\/silicon-yield\/resources\/overview\/expose-transistor-level-yield-limiters-with-cell-aware-diagnosis-d4ca5eb4-a89f-44e2-8197-a9af08afd225\/?cmpid=11832\" target=\"_blank\" rel=\"noopener noreferrer\">white paper<\/a><\/p>\n<p><a href=\"http:\/\/bit.ly\/1hf2bMq\" target=\"_blank\" rel=\"noopener noreferrer\"><img loading=\"lazy\" decoding=\"async\" class=\"alignnone wp-image-61 size-full\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/48\/2015\/09\/LinkedIn-Button.jpg\" alt=\"LinkedIn Button\" width=\"300\" height=\"70\" \/><\/a><\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Improve yield and failure analysis by identifying defects inside standard cells. Learn more in this new whitepaper.<\/p>\n","protected":false},"author":71644,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[],"industry":[],"product":[],"coauthors":[],"class_list":["post-352","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts\/352","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/users\/71644"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/comments?post=352"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts\/352\/revisions"}],"predecessor-version":[{"id":2327,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/posts\/352\/revisions\/2327"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/media?parent=352"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/categories?post=352"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/tags?post=352"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/industry?post=352"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/product?post=352"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/tessent\/wp-json\/wp\/v2\/coauthors?post=352"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}