International Test Conference live Sept 27-29 2022 in Anaheim, California

Back in person for the first time in two years, ITC 2022 promises to continue its tradition of showcasing best-in-class solutions for design verification, test, diagnosis and failure analysis. Now in its 50th year history, ITC is the world’s premier conference dedicated to electronic test. 

Tessent Silicon Lifecycle Solutions offers multiple opportunities to learn about its technology at the event. We invite you to come by our booth #115 for in-person discussions and live demonstrations or just to meet up with old friends.

Adaptive Intelligence Solutions

Tessent will showcase adaptive intelligence solutions, a new category of continuously learning applications. Adaptive intelligence, which includes packetized testing, machine learning and functional monitoring, makes testing smarter and more efficient. The Tessent Test Solutions product suite provides comprehensive silicon test and yield learning applications that address the challenges of manufacturing test, debug, and yield ramp for today’s most complex SoCs.

Customer Success with SSN

Hear a first-hand account of how Tessent Streaming Scan Network enabled Amazon to significantly improve scan performance while also reducing power and cost. Be sure to attend our Diamond Supporter presentation on Tuesday, September 27, at 11:00 am in the Main Ballroom following the plenary session to learn about this exciting news.

New 3D IC Technology

Tessent unveils an exciting new technology for complete DFT implementation of 2.5D and 3D designs. This technology simplifies multiple-die design architecture and is fully integrated with Tessent’s industry-leading DFT solutions. You will also hear the Siemens vision of deterministic test in the silicon lifecycle.

Siemens Booth Theater

Join Tessent in the booth #115 theater during open exhibitor hours where customers, partners and Siemens will present on such topics such as:

  • Tile-based design automation
  • Streaming Scan Network on-the-fly optimization
  • Streaming Scan Network for In-system test
  • ATPG Boost
  • Diagnosis with Tessent SSN
  • Fast IJTAG
  • 3D IC
  • Yield learning to boost manufacturing yields
  • Measuring analog test coverage

Set up a meeting at the show

Attendees are encouraged to set up appointments with Tessent representatives at the show. We’re just an email away.  Write to us at


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This article first appeared on the Siemens Digital Industries Software blog at