{"id":483,"date":"2018-05-04T01:09:20","date_gmt":"2018-05-04T08:09:20","guid":{"rendered":"https:\/\/blogs.plm.automation.siemens.com\/t5\/Siemens-Opcenter-Blog\/NOW-AVAILABLE-Camstar-Semiconductor-Suite-V7-SU3\/ba-p\/489123"},"modified":"2026-03-26T04:56:31","modified_gmt":"2026-03-26T08:56:31","slug":"now-available-camstar-semiconductor-suite-v7-su3","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/opcenter\/now-available-camstar-semiconductor-suite-v7-su3\/","title":{"rendered":"NOW AVAILABLE: Camstar Semiconductor Suite V7 SU3"},"content":{"rendered":"<p><P><SPAN>We are excited to announce the latest version of the Camstar\u2122 Semiconductor Suite has been released! Version 7 SU3 is now available.<\/SPAN><\/P><\/p>\n<p><P><SPAN>The latest Semiconductor Suite release delivers more robust out-of-the-box capabilities to help manufacturers improve productivity and efficiency. <\/SPAN><SPAN>Version 7 SU3 delivers the following capabilities:<\/SPAN><\/P><\/p>\n<p><UL><br \/>\n<LI><SPAN>Ability to load E142 wafer maps, view and pan on wafer map and edit bin data for the map <\/SPAN><\/LI><br \/>\n<LI><SPAN>Integration of Camstar Enterprise Platform (CEP) Scheduling into Semiconductor Suite with extensions for Semiconductor Suite for WIP and material control, equipment, tooling and masks <\/SPAN><\/LI><br \/>\n<LI><SPAN>Integration of CEP OEE functionality in Semiconductor Suite <\/SPAN><\/LI><br \/>\n<LI><SPAN>Modeling data hierarchy view (tree list) <\/SPAN><\/LI><br \/>\n<\/UL><br \/>\n<P><SPAN><span class=\"lia-inline-image-display-wrapper lia-image-align-inline\" style=\"width: 459px;\"><img loading=\"lazy\" decoding=\"async\" src=\"http:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/3\/2019\/09\/1_S-1.png\" width=\"459\" height=\"330\" alt=\"1_S.png\" title=\"1_S.png\" \/><\/span><\/SPAN><\/P><\/p>\n<p><P><SPAN>Already using the Camstar Semiconductor Suite? See <a href=\"http:\/\/cdn.camstar.industrysoftware.automation.siemens.com\/en\/wp-content\/uploads\/sites\/2\/2017\/09\/Siemens-PLM-Whats-new-in-Camstar-Semiconductor-Suite-V7-SU3-fs-69038-A3.pdf\" target=\"_self\" rel=\"nofollow noopener noreferrer\">what\u2019s new in v7 SU3<\/A>.<\/SPAN><\/P><\/p>\n<p><P><SPAN>Want to learn more? Camstar Semiconductor Suite for semiconductor manufacturing is a comprehensive manufacturing execution system (MES) that enables both wafer fabrication factories and assembly and test factories to meet traceability requirements, control production and integrate the shop floor into their enterprise resource planning (ERP) system and extended enterprise. <\/SPAN><\/P><\/p>\n<p><P><SPAN>Camstar Semiconductor Suite is a configurable, scalable and modular platform for semiconductor production. <a href=\"http:\/\/camstar.industrysoftware.automation.siemens.com\/en\/industries\/semiconductor-manufacturing\/\" target=\"_self\" rel=\"nofollow noopener noreferrer\">Find out more<\/A>.<\/SPAN><\/P><\/p>\n","protected":false},"excerpt":{"rendered":"<p>We are excited to announce the latest version of the Camstar\u2122 Semiconductor Suite has been released! Version 7 SU3 is now available.  <\/p>\n<p>  The latest Semiconductor Suite release delivers more &#8230;<\/p>\n","protected":false},"author":29943,"featured_media":487,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[],"industry":[],"product":[],"coauthors":[],"class_list":["post-483","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news"],"featured_image_url":"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/3\/2019\/09\/1_S-1.png","_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/posts\/483","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/users\/29943"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/comments?post=483"}],"version-history":[{"count":2,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/posts\/483\/revisions"}],"predecessor-version":[{"id":488,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/posts\/483\/revisions\/488"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/media\/487"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/media?parent=483"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/categories?post=483"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/tags?post=483"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/industry?post=483"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/product?post=483"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/opcenter\/wp-json\/wp\/v2\/coauthors?post=483"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}