{"id":3083,"date":"2020-05-12T16:53:00","date_gmt":"2020-05-12T20:53:00","guid":{"rendered":"https:\/\/blogs.sw.siemens.com\/news\/?p=3083"},"modified":"2026-03-26T11:33:55","modified_gmt":"2026-03-26T15:33:55","slug":"visualizer-debug-environment-webinar-series","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/news\/visualizer-debug-environment-webinar-series\/","title":{"rendered":"Visualizer Debug Environment Webinar Series"},"content":{"rendered":"\n<p>Complex testing and methodologies with complex silicon require powerful but simple-to-use debug solutions. In this 3-part <a href=\"https:\/\/www.mentor.com\/products\/fv\/series\/visualizer-uvm-verilog-vhdl\" target=\"_blank\" rel=\"noopener\"><strong>web seminar series<\/strong><\/a>, debug expert Rich Edelman explains the best debug techniques for UVM, Verilog, and VHDL and demonstrates how you can use the Visualizer Debug Environment to debug and verify your complex SoCs and FPGAs.<\/p>\n\n\n\n<p><strong>Sessions:<\/strong><\/p>\n\n\n\n<p><a href=\"https:\/\/www.mentor.com\/products\/fv\/events\/better-uvm-debug-with-visualizer\" target=\"_blank\" rel=\"noreferrer noopener\">Session 1 &#8211; Better UVM Debug with Visualizer<\/a><\/p>\n\n\n\n<ul class=\"wp-block-list\"><li><strong>Tuesday, June 2nd<\/strong><\/li><li>8:00 AM &#8211; 9:00 AM US\/Pacific<\/li><\/ul>\n\n\n\n<p><a href=\"https:\/\/www.mentor.com\/products\/fv\/events\/introduction-to-visualizer-for-the-verilog-users\" target=\"_blank\" rel=\"noreferrer noopener\">Session 2 &#8211; Introduction to Visualizer for the Verilog Users<\/a><\/p>\n\n\n\n<ul class=\"wp-block-list\"><li><strong>Tuesday, June 16th<\/strong><\/li><li>8:00 AM &#8211; 9:00 AM US\/Pacific<\/li><\/ul>\n\n\n\n<p><a href=\"https:\/\/www.mentor.com\/products\/fv\/events\/introduction-to-visualizer-for-the-vhdl-users\" target=\"_blank\" rel=\"noreferrer noopener\">Session 3 &#8211; Introduction to Visualizer for the VHDL Users<\/a><\/p>\n\n\n\n<ul class=\"wp-block-list\"><li><strong>Tuesday, June 30th<\/strong><\/li><li>8:00 AM &#8211; 9:00 AM US\/Pacific<\/li><\/ul>\n\n\n\n<p><strong>Learn more and <a href=\"https:\/\/www.mentor.com\/products\/fv\/series\/visualizer-uvm-verilog-vhdl\" target=\"_blank\" rel=\"noreferrer noopener\">register<\/a>.<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Complex testing and methodologies with complex silicon require powerful but simple-to-use debug solutions. In this 3-part web seminar series, debug&#8230;<\/p>\n","protected":false},"author":69878,"featured_media":3084,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[102,103,1,107,109],"tags":[126,365,367],"industry":[],"product":[272,345],"coauthors":[],"class_list":["post-3083","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-events","category-learning-resources","category-news","category-tips-tricks","category-webinar","tag-mentor","tag-questa","tag-verification","product-questa","product-veloce"],"featured_image_url":"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/17\/2020\/05\/visualizerdebugenvironment-FEA78BB7.png","_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/posts\/3083","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/users\/69878"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/comments?post=3083"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/posts\/3083\/revisions"}],"predecessor-version":[{"id":3085,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/posts\/3083\/revisions\/3085"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/media\/3084"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/media?parent=3083"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/categories?post=3083"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/tags?post=3083"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/industry?post=3083"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/product?post=3083"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/news\/wp-json\/wp\/v2\/coauthors?post=3083"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}