{"id":360,"date":"2017-04-20T10:21:55","date_gmt":"2017-04-20T17:21:55","guid":{"rendered":"https:\/\/blogs.mentor.com\/expertinsights\/?p=360"},"modified":"2026-03-26T16:11:04","modified_gmt":"2026-03-26T20:11:04","slug":"article-roundup-sram-redundancy-pcb-design-electric-vehicles-human-vs-compiler-and-artificial-intelligence","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/expertinsights\/2017\/04\/20\/article-roundup-sram-redundancy-pcb-design-electric-vehicles-human-vs-compiler-and-artificial-intelligence\/","title":{"rendered":"Article Roundup: SRAM Redundancy, PCB Design, Electric Vehicles, Human vs. Compiler, and Artificial Intelligence"},"content":{"rendered":"
    \n
  1. Mentor\u2019s Xpedition virtualizes simulation for ruggedized, safety-critical designs<\/a><\/strong><\/li>\n
  2. Calibre Can Calculate Chip Yields Correlated to Compromised SRAM Cells<\/a><\/strong><\/li>\n
  3. What the Chevy Bolt Really Means For the Electric Vehicle Market<\/a><\/strong><\/li>\n
  4. Give Me a Human Programmer over an Automated Compiler<\/a><\/strong><\/li>\n
  5. Artificial Intelligence and Engineering<\/a><\/strong><\/li>\n<\/ol>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Mentor\u2019s Xpedition Virtualizes Simulation for Ruggedized, Safety-Critical Designs<\/a><\/strong>
    \nTech Design Forum<\/em><\/p>\n

    \"\"PCB design for reliability (DFR) techniques for ruggedized, safety-critical designs is going virtual. The virtual simulation capabilities in Mentor\u2019s Xpedition helps companies catch problems earlier to improve quality, while saving time and cost by reducing physical tests. Read a summary of Xpedition’s Vibration and Acceleration Analysis\u00a0feature in this article.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Calibre Can Calculate Chip Yields Correlated to Compromised SRAM Cells<\/a><\/strong>
    \nSemiWiki<\/em><\/p>\n

    \"\"How much SRAM redundancy should be provisioned on an SoC design? Calibre YieldAnalyzer critical area analysis can help you determine the optimal redundancy level. It starts by taking the defect density information for each layer to calculate the average number of failures, and eventually performs what-if analysis to zero in on the optimal amount of repair resources.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    What the Chevy Bolt Really Means For the Electric Vehicle Market<\/a><\/strong>
    \nSemiconductor Engineering<\/em><\/p>\n

    \"\"For electric vehicles (EVs), it\u2019s no longer a question of whether they\u2019ll enter the mainstream, but rather how rapidly they\u2019ll be adopted in global markets. Brian Derrick, VP at Mentor, a Siemens Business, examines who has the upper hand in the EV market – startups or established companies?<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Give Me a Human Programmer over an Automated Compiler<\/a><\/strong>
    \nEmbedded Computing Design<\/em><\/p>\n

    \"\"When writing embedded code, does it make more sense to use a human programmer, or an automated compiler? A human programmer wouldn\u2019t want to completely rewrite any code just because some small aspect of the requirements changed, but a compiler doesn\u2019t care. Colin Walls walks readers through an example of this scenario using a switch statement.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Artificial Intelligence and Engineering<\/a><\/strong>
    \nEngineering.com<\/em><\/p>\n

    \"\"Artificial Intelligence (AI) has waxed and waned in the public eye since its conception in 1956. Today, AI is once again in the spotlight with machine learning emerging as one of the most fruitful avenues of AI research. This article discusses the profound impact AI will have across engineering including autonomous vehicles, data structuring, image processing, and more.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":"

    Mentor\u2019s Xpedition virtualizes simulation for ruggedized, safety-critical designs Calibre Can Calculate Chip Yields Correlated to Compromised SRAM Cells What the…<\/p>\n","protected":false},"author":71674,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[],"industry":[],"product":[],"coauthors":[],"class_list":["post-360","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts\/360","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/users\/71674"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/comments?post=360"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts\/360\/revisions"}],"predecessor-version":[{"id":2015,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts\/360\/revisions\/2015"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/media?parent=360"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/categories?post=360"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/tags?post=360"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/industry?post=360"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/product?post=360"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/coauthors?post=360"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}