{"id":1912,"date":"2021-02-26T20:04:04","date_gmt":"2021-02-27T01:04:04","guid":{"rendered":"https:\/\/blogs.sw.siemens.com\/expertinsights\/?p=1912"},"modified":"2026-03-26T16:15:39","modified_gmt":"2026-03-26T20:15:39","slug":"surprise-dvcon-2021-has-an-ams-track-see-you-there","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/expertinsights\/2021\/02\/26\/surprise-dvcon-2021-has-an-ams-track-see-you-there\/","title":{"rendered":"Surprise! DVCon 2021 has an AMS Track – See you there"},"content":{"rendered":"\n

It is fascinating and often surprising to find the origin of words that we commonly use every day. For example, in the verification world, we have been hearing the word \u201cVerilog\u201d for several decades and we know that Verilog (IEEE 1364 std.), is a hardware description language (HDL) used to model electronic systems. However very few know that this word is a portmanteau of the words \u201cverification\u201d and \u201clogic\u201d [1<\/a>]. I learned about this at DVCon 2019, the time when we used to have physical\/live events.<\/p>\n\n\n\n

The Design and Verification Conference (DVCon) is one of the premium conference covering the application of EDA tools, languages, and IPs for the design and verification of semiconductors ICs. It also provides a great opportunity to network with like-minded people such as design and verification engineers, IP integrators, and chip architects.<\/p>\n\n\n\n

DVCon has several tracks with much focus on digital verification, however there is also an AMS track (surprised?) which focuses on Analog and Mixed Signal Verification tools and methodologies. We are excited to announce that this year, Siemens EDA is presenting a session in this track in partnership with Analog Value ltd. The title of the talk is:<\/p>\n\n\n\n

A Novel Variation-Aware Mixed-Signal Verification Methodology to achieve High-Sigma Variation coverage at nanometer designs<\/em><\/p>\n\n\n\n

Variation analysis is significantly important in modern nanometer process geometries especially for mission critical applications such as health, automotive and industrial. Traditional verification approaches to analyze statistical variations are time consuming and provides inadequate coverage. In this session we discuss a novel \u2018variation aware mixed signal verification\u2019 methodology that relies on designers knowledge and use of machine learning based EDA tools. This approach is applied for a Time-Domain 2-step ADC architecture which is used in automotive RADAR application and is fabricated with 22nm FDSOI Global Foundry process<\/p>\n\n\n\n

Please join us at DVCon 2021 on March 3 at 10AM. And if you like our talk, do leave us a review on Yelp<\/em><\/strong> (jk), which by-the-way is a portmanteau of \u201cYellow Pages\u201d + \u201chelp\u201d \ud83d\ude42<\/p>\n\n\n\n

To find more: visit DVCon Agenda<\/a><\/p>\n\n\n\n

\"Siemens
DVCon 2021 AMS Session presented by Siemens EDA & Analog Value Ltd.<\/figcaption><\/figure>\n\n\n\n

[1] http:\/\/archive.computerhistory.org\/resources\/access\/text\/2013\/11\/102746653-05-01-acc.pdf<\/p>\n","protected":false},"excerpt":{"rendered":"

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