{"id":178,"date":"2017-01-30T16:20:31","date_gmt":"2017-01-30T23:20:31","guid":{"rendered":"https:\/\/blogs.mentor.com\/expertinsights\/?p=178"},"modified":"2026-03-26T16:10:36","modified_gmt":"2026-03-26T20:10:36","slug":"article-roundup-emulation-ic-design-automotive-rtos-and-semiconductor-spending","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/expertinsights\/2017\/01\/30\/article-roundup-emulation-ic-design-automotive-rtos-and-semiconductor-spending\/","title":{"rendered":"Article Roundup: Emulation, IC Design, Automotive, RTOS, and Semiconductor Spending"},"content":{"rendered":"
    \n
  1. Hardware Emulation for Multi-Level Debugging Methodology<\/a><\/strong><\/li>\n
  2. Transistor-Level Defect Diagnosis<\/a><\/strong><\/li>\n
  3. Electric Vehicles Spur Startups<\/a><\/strong><\/li>\n
  4. Tasks, the Context Switch, and Interrupts<\/a><\/strong><\/li>\n
  5. The Power and Limits of Money<\/a><\/strong><\/li>\n<\/ol>\n

    \u00a0<\/strong><\/p>\n

    Hardware Emulation for Multi-Level Debugging Methodology<\/a><\/strong>
    \nEmbedded Computing<\/em>
    \n\"AA debugging methodology based on multiple abstraction levels starts with embedded software at the highest level, and moves down in abstraction levels to trace the behavior of individual hardware elements. Find out how transaction-based emulation enables both hardware designers and software developers to share the same system and design representations to quickly debug hardware and software interactions.<\/p>\n

    \u00a0\u00a0\u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Transistor-Level Defect Diagnosis<\/a><\/strong>
    \nSemiconductor Engineering<\/em>
    \n\"CellAwareDiagnosisNeed to diagnosis silicon failures faster and with more accuracy? Try the new cell-aware diagnosis to pinpoint the source of failures within standard cells. Cell-aware diagnosis has been shown to improve diagnosis resolution for cell-internal defects by up to 70X on a complex cell, and by over 10X on average.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Electric Vehicles Spur Startups<\/a><\/strong>
    \nThe Detroit News<\/em>
    \nAutomotive electrification has enabled the global automotive industry to see a massive increase in new entrants over the past decade. Today there are nearly 300 companies pursuing the development of an electric vehicle ranging from startups to century old OEMs. Who will win \u2013 the old or new guard?<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    Tasks, the Context Switch, and Interrupts<\/a><\/strong>
    \nEmbedded.com<\/em>
    \n\"RTOSRevealed290\"In a RTOS, it\u2019s necessary to be able to identify and specify each task. The designers of different RTOSes have taken different approaches to task identifiers, but four broad strategies can be identified. Colin Walls examines these four task strategies and takes a deeper look into context switch mechanism and interrupts.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n

    The Power and Limits of Money<\/a><\/strong>
    \nSemiconductor Engineering<\/em>
    \nWally Rhines comments on how engineering teams make their dollars work on limited budgets. The issue is as important as ever, given the semiconductor industry\u2019s unrelenting margin and cost pressure and the growing competition for top talent. See what motivates successful engineering organizations, and why Google, Facebook, and Amazon don\u2019t get or keep all the talent.<\/p>\n

    \u00a0<\/strong>
    \n\u00a0<\/strong><\/p>\n","protected":false},"excerpt":{"rendered":"

    Hardware Emulation for Multi-Level Debugging Methodology Transistor-Level Defect Diagnosis Electric Vehicles Spur Startups Tasks, the Context Switch, and Interrupts The…<\/p>\n","protected":false},"author":71674,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[],"industry":[],"product":[],"coauthors":[],"class_list":["post-178","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts\/178","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/users\/71674"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/comments?post=178"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts\/178\/revisions"}],"predecessor-version":[{"id":1998,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/posts\/178\/revisions\/1998"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/media?parent=178"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/categories?post=178"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/tags?post=178"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/industry?post=178"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/product?post=178"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/expertinsights\/wp-json\/wp\/v2\/coauthors?post=178"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}