Design, Automation, and Test in Europe (DATE) is the European event for electronic systems design in test held in Swisstech, Lausanne, Switzerland March 27-31 2017. Mentor Graphics experts will be participating in the Exhibition Theatre, technical program, and workshops. You can view the full DATE 2017 agenda here.
10.8b Mentor’s Custom/Analog Solutions for IoT Edge Devices
Thursday, March 30 | 12:00pm
IP4-18 Power Pre-Characterized Meshing Algorithm for Finite Element Thermal Analysis of Integrated Circuits
Thursday, March 30 | 10:00am
This paper presents an adaptive meshing technique suitable for steady state finite element (FE) based thermal analysis of integrated circuits (ICs). The algorithm presented is a non-iterative one where the technology used is first pre-characterized. The characterization results are then used for scanning the layout to detect high power regions then fine meshing them. Finally, the analysis is done only once. This makes it faster than conventional iterative adaptive meshing methods. The algorithm results showed comparable accuracy and better performance when compared to the flux based (iterative) and the power aware (non-iterative) algorithms.
Simultaneous Measurement of Defect Coverage and Tolerance in AMS ICs for ISO26262
Friday, March 31 | 1:15pm
Silicon Photonics Scalable Design Framework: From Design Concept to Physical Verification
Friday, March 31 | 4:20pm