{"id":3608,"date":"2025-11-18T12:12:57","date_gmt":"2025-11-18T17:12:57","guid":{"rendered":"https:\/\/blogs.sw.siemens.com\/calibre\/?p=3608"},"modified":"2026-03-26T16:24:25","modified_gmt":"2026-03-26T20:24:25","slug":"design-rule-checking-errors-and-how-calibre-nmdrc-helps-avoid-them","status":"publish","type":"post","link":"https:\/\/blogs.sw.siemens.com\/calibre\/2025\/11\/18\/design-rule-checking-errors-and-how-calibre-nmdrc-helps-avoid-them\/","title":{"rendered":"6 frequent design rule checking errors every IC designer should know \u2013 and how Calibre nmDRC helps you avoid them"},"content":{"rendered":"\n<p>By John Ferguson<\/p>\n\n\n\n<p><strong><em>When design rule checking becomes the make-or-break moment<\/em><\/strong><\/p>\n\n\n\n<p>Every integrated circuit designer eventually reaches the same tense moment: that last design rule check before tape-out.<br>&#8211; If it passes, the layout heads to manufacturing.<br>&#8211; If it fails, days or weeks of rework can delay schedules and burn resources.<\/p>\n\n\n\n<p>Design rule checking (DRC) is the final gate between design intent and manufacturable silicon. It verifies that every layer in a layout follows the geometrical and connectivity constraints defined by the foundry\u2014rules refined through years of process characterization.<\/p>\n\n\n\n<p>But the truth is, <em>not all design rule checking runs are created equal<\/em>. The accuracy of the results depends entirely on the engine behind the rule deck. And that\u2019s why <a href=\"https:\/\/eda.sw.siemens.com\/en-US\/ic\/calibre-design\/physical-verification\/nmdrc\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>Calibre nmDRC<\/strong><\/a> remains the trusted foundation for accurate, high-performance <a href=\"https:\/\/eda.sw.siemens.com\/en-US\/ic\/calibre-design\/physical-verification\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>physical verification<\/strong><\/a>.<\/p>\n\n\n\n<p>Let\u2019s explore six DRC error types that appear frequently\u2014and how Calibre nmDRC gives designers the visibility, precision and control to resolve them well before final sign-off by fixing gross errors throughout the design process. <a>\u00a0<\/a><\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>1. Metal spacing and enclosure violations<\/strong><\/h2>\n\n\n\n<p>At nanometer dimensions, even the smallest geometric discrepancy can have major yield consequences. Spacing and enclosure violations occur when two shapes are placed too close together or when one layer (for example, a contact) is insufficiently enclosed by another (such as metal).<\/p>\n\n\n\n<p>These checks sound simple but quickly become complex. Advanced rules often depend on local context\u2014width-dependent spacing, multi-layer interactions and even stress or topography effects.<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"532\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure-1024x532.jpg\" alt=\"Diagrams showing the metal spacing concept, which is the minimum required spacing between two runs of metal, and the enclosure rule, which is the minimum required spacing between a surrounding layer (enclosure) and the inner layer it contains\" class=\"wp-image-3609\" style=\"width:704px;height:auto\" srcset=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure-1024x532.jpg 1024w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure-600x312.jpg 600w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure-768x399.jpg 768w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure-900x468.jpg 900w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure.jpg 1466w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure><\/div>\n\n\n<p><a id=\"_msocom_1\"><\/a><\/p>\n\n\n\n<p><strong>How Calibre nmDRC helps<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>A geometry engine optimized for nanometer precision measures exact distances and overlaps, even in highly curved or non-Manhattan layouts.<\/li>\n\n\n\n<li>Hierarchical verification ensures that spacing checks scale efficiently, no matter how many repeated cells a design contains.<\/li>\n<\/ul>\n\n\n\n<p>By combining rule-driven and equation-based approaches, Calibre nmDRC captures both deterministic and conditional spacing behaviors\u2014so nothing slips through.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>2. Density and fill errors<\/strong><\/h2>\n\n\n\n<p><strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/technical-paper-modeling-ecd-with-machine-learning-to-improve-cmp-simulation\/\" target=\"_blank\" rel=\"noreferrer noopener\">Chemical-mechanical polishing (CMP)<\/a><\/strong> demands consistent surface density across each layer. Uneven pattern densities can cause over- or under-polishing, leading to metal dishing or dielectric erosion.<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"500\" height=\"326\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig2-fill.jpg\" alt=\"an image showing metal fill for even density. This image shows the fill in two colors because they will be decomposed and printed on two separate masks.\" class=\"wp-image-3610\"\/><\/figure><\/div>\n\n\n<p><strong>How Calibre nmDRC helps<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Integrated density window checking quantifies metal coverage across the layout to ensure compliance with foundry thresholds.<\/li>\n\n\n\n<li><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/fact-sheet-calibre-yieldenhancer-with-smartfill\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>Calibre YieldEnhancer with SmartFill<\/strong><\/a> automatically inserts model-based fill patterns that achieve uniformity, calling Calibre nmDRC to ensure that the fill doesn\u2019t compromise timing or violating other spacing rules.<\/li>\n\n\n\n<li><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/technical-paper-automating-fill-back-annotation-in-the-custom-layout-design-environment\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>Back-annotation of SmartFill<\/strong><\/a> data to, LEF\/DEF, OpenAccess, OASIS and GDSII ensures downstream extraction and simulation reflect the final filled layout accurately.<\/li>\n<\/ul>\n\n\n\n<p>For complex SoCs, SmartFill and nmDRC operate as a single ecosystem\u2014analyzing density, inserting fill and verifying the results in one continuous flow.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>3. Antenna effects<\/strong><\/h2>\n\n\n\n<p>As transistors shrink, thin gate oxides become increasingly vulnerable to plasma charging during fabrication. Long interconnects can accumulate charge and discharge into gates, permanently damaging the device.<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"521\" height=\"495\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig3-antenna.jpg\" alt=\"\" class=\"wp-image-3611\" style=\"width:521px;height:auto\"\/><\/figure><\/div>\n\n\n<p><a id=\"_msocom_1\"><\/a><strong>How Calibre nmDRC helps<\/strong><\/p>\n\n\n\n<div class=\"wp-block-group is-nowrap is-layout-flex wp-container-core-group-is-layout-ad2f72ca wp-block-group-is-layout-flex\">\n<ul class=\"wp-block-list\">\n<li>Dedicated antenna rule checks calculate precise metal-to-gate area ratios per process rules to check for transistor failures that can happen during the manufacture process when charge is induced on the metal wires.<\/li>\n\n\n\n<li>eqDRC property filtering provides numeric feedback, highlighting nets that exceed thresholds. eqDRC is an operation of SVRF (standard verification rules format).<\/li>\n\n\n\n<li>Annotated error markers guide designers directly to problem nets in <strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/fact-sheet-calibre-rve\/\" target=\"_blank\" rel=\"noreferrer noopener\">Calibre RVE<\/a><\/strong> within their custom or automated design tools.<\/li>\n<\/ul>\n<\/div>\n\n\n\n<p>These checks are essential in high-voltage, analog or RF layouts, where antenna sensitivity varies across nets. With Calibre nmDRC, engineers can measure, visualize and correct antenna risk with confidence.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>4. Via and contact misalignment<\/strong><\/h2>\n\n\n\n<p>Each via that connects one metal layer to another represents a potential failure point. Even slight misalignment or insufficient enclosure can create high-resistance contacts or opens\u2014defects that are nearly impossible to fix post-silicon.<\/p>\n\n\n\n<p><strong>How Calibre nmDRC helps<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Direct database access allows the design rule checking engine to read native layout formats (Milkyway, LEF\/DEF, OpenAccess, OASIS, GDSII) without conversion, preserving layer precision.<\/li>\n\n\n\n<li>Hierarchical checking reuses data for repeated via structures, reducing runtime without sacrificing accuracy.<\/li>\n<\/ul>\n\n\n\n<p>Calibre nmDRC\u2019s precision ensures that every via meets the foundry\u2019s geometry and overlay requirements, even in dense interconnect stacks.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>5. Pattern-based hotspots<\/strong><\/h2>\n\n\n\n<p>Some yield-limiting issues aren\u2019t easily captured by rule statements at all. They arise from <em>specific geometric configurations<\/em>\u2014for instance, line-end bridges, notch corners or complex multi-layer patterns that interact poorly during lithography.<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"476\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching-1024x476.jpg\" alt=\"\" class=\"wp-image-3612\" style=\"width:740px;height:auto\" srcset=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching-1024x476.jpg 1024w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching-600x279.jpg 600w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching-768x357.jpg 768w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching-1536x714.jpg 1536w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching-900x418.jpg 900w, https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig4-pattern-matching.jpg 1629w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure><\/div>\n\n\n<p><strong>How Calibre nmDRC helps<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/video-calibre-productivity-and-reliability-enhancement-solutions\/\" target=\"_blank\" rel=\"noreferrer noopener\">Pattern Matching<\/a><\/strong> technology, built directly into the nmDRC engine, searches for known problematic shapes within the same rule deck used for traditional DRC.<\/li>\n\n\n\n<li>Foundries often include these pattern libraries in their sign-off decks, giving designers the same predictive insight used during process qualification.<\/li>\n\n\n\n<li><strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/video-calibre-multi-patterning-overview\/\" target=\"_blank\" rel=\"noreferrer noopener\">Multi-patterning<\/a> <\/strong>and optical-grid checks further expand coverage to lithography-driven constraints below 28 nm. <\/li>\n<\/ul>\n\n\n\n<p>By integrating pattern analysis directly with rule checking, Calibre nmDRC enables a single unified flow that covers both standard and context-sensitive geometries.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\">6. <strong>High-voltage checks<\/strong><\/h2>\n\n\n\n<p>High-voltage checks are essential for designs with significant voltage differences, like power management units, where standard geometric spacing isn&#8217;t enough. They ensure that adjacent metal lines have sufficient clearance based on their potential difference, preventing electrical breakdown, arcing and reliability issues.<\/p>\n\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"476\" height=\"540\" src=\"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig5-highvoltage.jpg\" alt=\"\" class=\"wp-image-3614\"\/><\/figure><\/div>\n\n\n<p><strong>How Calibre nmDRC helps<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Voltage-aware rule application with DFM DV<\/strong>: Calibre nmDRC, leveraging its <a href=\"https:\/\/eda.sw.siemens.com\/en-US\/ic\/calibre-design\/design-for-manufacturing\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>Design for Manufacturability (DFM)<\/strong><\/a> Design Verification (DV) capabilities, dynamically applies spacing rules that vary based on the voltage difference between adjacent nets. This goes beyond static geometric checks to intelligent, electrically-aware verification.<\/li>\n\n\n\n<li><strong>Integrated net property analysis<\/strong>: It seamlessly integrates netlist information, including voltage assignments, directly with the physical layout data. This allows Calibre nmDRC to precisely calculate potential differences and apply corresponding high-voltage spacing requirements.<\/li>\n\n\n\n<li><strong>Comprehensive breakdown prevention<\/strong>: Foundries can define intricate high-voltage rule sets within Calibre nmDRC, enabling designers to verify that their layouts meet stringent electrical isolation requirements, preventing costly field failures and ensuring product safety.<\/li>\n<\/ul>\n\n\n\n<p>With Calibre nmDRC, designers can confidently tackle the complexities of high-voltage integration, knowing their designs are robust against electrical breakdown and meet critical reliability standards.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Beyond finding errors: fixing them faster<\/strong><\/h2>\n\n\n\n<p>Catching a violation is only half the job\u2014the real value lies in how quickly it can be understood and corrected.<br>Calibre nmDRC includes advanced debugging and reporting capabilities designed to shorten this loop dramatically.<\/p>\n\n\n\n<p><strong>Key productivity features<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong><a href=\"https:\/\/eda.sw.siemens.com\/en-US\/ic\/calibre-design\/interfaces\/vision-ai\/\" target=\"_blank\" rel=\"noreferrer noopener\">Calibre Vision AI<\/a><\/strong> is a powerful debugging environment that uses AI to identify systematic issues and address the most impactful errors early.<\/li>\n\n\n\n<li><strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/fact-sheet-calibre-rve\/\" target=\"_blank\" rel=\"noreferrer noopener\">Calibre RVE<\/a><\/strong> provides interactive cross-probing between error markers and layout shapes.<\/li>\n\n\n\n<li>Customizable HTML batch reports let engineers pre-screen, sort and filter errors to focus on critical categories.<\/li>\n\n\n\n<li>Engineers can group results by user-defined attributes, embed snapshots and even use colormaps or histograms to illustrate violation distribution.<\/li>\n\n\n\n<li><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/fact-sheet-calibre-auto-waivers\/\" target=\"_blank\" rel=\"noreferrer noopener\"><strong>Automated Waiver Management<\/strong><\/a> removes pre-approved exceptions from subsequent runs, keeping reports clean and traceable.<\/li>\n<\/ul>\n\n\n\n<p>These capabilities make <strong><a href=\"https:\/\/eda.sw.siemens.com\/en-US\/ic\/calibre-design\/physical-verification\/nmdrc\/\" target=\"_blank\" rel=\"noreferrer noopener\">physical verification<\/a> <\/strong>review cycles faster, more visual and more collaborative\u2014an essential advantage for large, distributed design teams.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Shift-left design rule checking: catching problems earlier<\/strong><\/h2>\n\n\n\n<p>Waiting for a full sign-off run to reveal thousands of errors late in the schedule is no longer practical. To compress verification cycles, design teams are moving design rule checking earlier in the layout process\u2014a methodology known as <em><strong><a href=\"https:\/\/blogs.sw.siemens.com\/calibre\/2024\/10\/30\/shift-left-in-ic-design-a-holistic-strategy-for-faster-smarter-verification\/?pk_vid=43645e05716e1d4566efc0d021a81cf9176279812580055d\" target=\"_blank\" rel=\"noreferrer noopener\">shift-left verification<\/a><\/strong>.<\/em><\/p>\n\n\n\n<p><strong><a href=\"https:\/\/eda.sw.siemens.com\/en-US\/ic\/calibre-design\/physical-verification\/early-verification\/?ste_sid=493edfea6e348eaee238cfdc86692067\" target=\"_blank\" rel=\"noreferrer noopener\">Calibre nmDRC Recon<\/a><\/strong> makes that shift tangible.<\/p>\n\n\n\n<p>It executes <em>targeted, early-stage DRC<\/em> runs using partial rule subsets, giving designers instant feedback as they edit layouts.<br>Because Recon uses the same Calibre rule syntax and geometry engine as sign-off DRC, results correlate perfectly\u2014eliminating redundant debugging at the end of the flow.<\/p>\n\n\n\n<p>Early design rule checking visibility means fewer late-stage surprises, faster convergence and better collaboration between layout and verification teams.<\/p>\n\n\n\n<figure class=\"wp-block-embed is-type-video is-provider-youtube wp-block-embed-youtube wp-embed-aspect-16-9 wp-has-aspect-ratio\"><div class=\"wp-block-embed__wrapper\">\n<iframe loading=\"lazy\" title=\"Calibre nmDRC Recon \u2013 Streamline and Accelerate Your IC Verification Flow\" width=\"640\" height=\"360\" src=\"https:\/\/www.youtube.com\/embed\/UctykM111ko?feature=oembed\" frameborder=\"0\" allow=\"accelerometer; autoplay; clipboard-write; encrypted-media; gyroscope; picture-in-picture; web-share\" referrerpolicy=\"strict-origin-when-cross-origin\" allowfullscreen><\/iframe>\n<\/div><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Why foundries and designers trust Calibre nmDRC<\/strong><\/h2>\n\n\n\n<p>Every check discussed above\u2014spacing, density, antenna, via and pattern analysis\u2014relies on consistent correlation between design and manufacturing. That consistency exists because foundries <em>build their rule decks in Calibre nmDRC<\/em>.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Used by the vast majority of major foundries<strong> <\/strong>for process development and validation<\/li>\n\n\n\n<li>Provides comprehensive, accurate and proven sign-off physical verification across all technology nodes<\/li>\n\n\n\n<li>Offers fast, scalable runtime from single CPU to enterprise compute grids<\/li>\n\n\n\n<li>Supports direct database access to major design formats without data conversion<\/li>\n\n\n\n<li>Delivers enhanced<strong> <a href=\"https:\/\/resources.sw.siemens.com\/en-US\/technical-paper-making-drc-debug-more-focused-improves-designer-productivity\/\" target=\"_blank\" rel=\"noreferrer noopener\">DRC debugging<\/a><\/strong> for faster results with highest accuracy<\/li>\n<\/ul>\n\n\n\n<p>In short, the same tool that defines the rules is the one verifying your layout\u2014closing the loop between process development and design implementation.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>A culture of continual innovation<\/strong><\/h2>\n\n\n\n<p><strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/video-calibre-physical-verification-nmdrc-update\/\" target=\"_blank\" rel=\"noreferrer noopener\">Calibre nmDRC doesn\u2019t stand still<\/a><\/strong><\/p>\n\n\n\n<p>As design geometries evolve, Siemens EDA\u2019s Calibre team continually extends the platform with new methodologies\u2014optical grid and pitch checking, equation-based analysis, model-based fill and 3D IC verification.<br>This commitment ensures that the tool remains ahead of emerging process challenges and ready for the next generation of nodes.<\/p>\n\n\n\n<p>When the industry moved to multi-patterning, Calibre nmDRC already had decomposition analysis.<br>When designers needed faster comparisons, <strong><a href=\"https:\/\/resources.sw.siemens.com\/en-US\/video-how-to-optimize-calibre-fastxor-for-layout-vs-layout-design-compare\/\" target=\"_blank\" rel=\"noreferrer noopener\">Calibre Fast XOR<\/a><\/strong> made layout-versus-layout checks near-instant.<br>And as DRC debugging became more data-intensive, customizable HTML reporting and database-level visualization brought clarity and speed to complex error analysis.<\/p>\n\n\n\n<p>That steady pace of innovation, and deep partnerships throughout the semiconductor ecosystem, keeps Calibre nmDRC aligned with the needs of modern IC design.<\/p>\n\n\n\n<h2 class=\"wp-block-heading\"><strong>Conclusion: The design rule checking standard for first-pass silicon<\/strong><\/h2>\n\n\n\n<p>Design rule checking remains the most fundamental measure of a design\u2019s manufacturability.<br>But in an era of exploding rule complexity and shrinking process windows, <em>trusting your DRC results<\/em> is just as important as passing them.<\/p>\n\n\n\n<p>By combining foundry-certified accuracy, advanced rule characterization, hierarchical scalability and unmatched debug visibility, Calibre nmDRC enables engineers to move from violation discovery to resolution with maximum efficiency.<\/p>\n\n\n\n<p>It\u2019s more than a DRC tool\u2014it\u2019s the verification standard that connects design, manufacturing and innovation.<\/p>\n\n\n\n<p>When it\u2019s Calibre-clean throughout the design stages, it\u2019s truly sign-off-ready.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Learn about some common design rule checking (DRC) violations in integrated circuit layouts\u2014and how Calibre nmDRC helps engineers catch, analyze and resolve them quickly to ensure first-pass silicon success.<\/p>\n","protected":false},"author":71645,"featured_media":3609,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[],"industry":[],"product":[],"coauthors":[712],"class_list":["post-3608","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news"],"featured_image_url":"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/50\/2025\/11\/fig1-spacing-enclosure.jpg","_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/posts\/3608","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/users\/71645"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/comments?post=3608"}],"version-history":[{"count":5,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/posts\/3608\/revisions"}],"predecessor-version":[{"id":3627,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/posts\/3608\/revisions\/3627"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/media\/3609"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/media?parent=3608"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/categories?post=3608"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/tags?post=3608"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/industry?post=3608"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/product?post=3608"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/calibre\/wp-json\/wp\/v2\/coauthors?post=3608"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}