Resetting Expectations on Multi-Patterning Decomposition and Checking Part 2

Resetting Expectations on Multi-Patterning Decomposition and Checking Part 2

By David Abercrombie, Mentor Graphics Triple and quadruple patterning can baffle even the most experienced designers. David Abercrombie has some…

You’re Not Alone

You’re Not Alone

By Srinivas Velivala, Mentor Graphics Calibre How-To videos replace your roadblocks with fast solutions for tricky verification problems

Resetting Expectations on Multi-Patterning Decomposition and Checking

Resetting Expectations on Multi-Patterning Decomposition and Checking

By David Abercrombie, Mentor Graphics Some common misconceptions about multi-patterning processes and just how they work.

Design Rule Checking for Silicon Photonics

Design Rule Checking for Silicon Photonics

By Ruping Cao, Mentor Graphics Verifying silicon photonics designs requires new techniques, like equation-based DRC

MEMS Technology and Manufacturing on the Microscale

MEMS Technology and Manufacturing on the Microscale

By Carey Robertson and Khaled AbouZeid, Mentor Graphics Designers incorporating MEMS devices into high-volume CMOS ICs need new processes, data,…

Electrical Overstress Detection and Debugging

Electrical Overstress Detection and Debugging

By Dina Medhat, Mentor Graphics Automated voltage propagation provides an accurate way to detect and correct those hard-to-find EOS conditions…

Case Studies in P&R Double Patterning Debug: Part Two

Case Studies in P&R Double Patterning Debug: Part Two

David Abercrombie continues his expert advice to P&R and chip finishing engineers on understanding and debugging multi-patterning errors accurately and…

Case Studies in Double-Patterning Debug: Part One

Case Studies in Double-Patterning Debug: Part One

By David Abercrombie, Mentor Graphics Multi-patterning errors in P&R layouts can be intricate, and their solutions may not be obvious

The Changing (and Challenging) IC Reliability Landscape

The Changing (and Challenging) IC Reliability Landscape

By Matthew Hogan, Mentor Graphics Reliability issues have gone way beyond DRC and LVS verification…