Pattern Matching In Test and Yield Analysis

By Jonathan Muirhead and Geir Eide, Mentor Graphics Analyzing fail data with pattern matching helps…

Reliability Scoring for the Automotive Market

By Jeff Wilson, Mentor Graphics Companies designing automotive electronics must understand how variability affects design…

Interconnect Robustness Depends on Scaling for Reliability Analysis

By Matthew Hogan, Mentor Graphics Fast simulation and PEX are both crucial to interconnect robustness…

How Do I ECO a Multi-Patterned Design?

By David Abercrombie and Alex Pearson, Mentor Graphics Applying ECOs to multiĀ­patterned designs can be…

Collaborative SoC Verification

By Matthew Hogan, Mentor Graphics The increasing use of SoC designs turns efficient IC design…

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

By Karen Chow, Mentor Graphics Signal integrity analysis at advanced nodes requires new and enhanced…

Five Steps to Double Patterning Debug Sucess

By David Abercrombie, Mentor Graphics Shhhh…David Abercrombie’s revealing the secrets of successful DP debugging!…

Resetting Expectations on Multi-Patterning Decomposition and Checking Part 2

By David Abercrombie, Mentor Graphics Triple and quadruple patterning can baffle even the most experienced…

You’re Not Alone

By Srinivas Velivala, Mentor Graphics Calibre How-To videos replace your roadblocks with fast solutions for…