Learn essential circuit testing techniques with our brand-new Design for Test course.\u00a0 Get practice with automation methods for low-cost manufacturing tests. This course is suitable for\u00a0senior undergraduate and graduate students of computer engineering, electronics and telecommunications.<\/p>\n\n\n\n
This course provides a coverage of the most essential digital circuit testing techniques, including practices and automation methods for high-quality low-cost manufacturing test. In addition to fault modeling, test generation and fault simulation, it covers design for testability, built-in self-test for random logic and memory arrays altogether with the newest topics related to embedded test methodologies developed specifically to reduce test data volume, test time, and yield learning.<\/p>\n\n\n\n
Strong digital design skills, computer architecture, and HDL programming is recommended for this course. <\/p>\n\n\n\n
Download the Design For Test curriculum here<\/a><\/em> and check out all of our other offerings on our curriculum hub here<\/a><\/em>.<\/p>\n\n\n","protected":false},"excerpt":{"rendered":" Learn essential circuit testing techniques with our brand-new Design for Test course.\u00a0 Get practice with automation methods for low-cost manufacturing…<\/p>\n","protected":false},"author":72538,"featured_media":4159,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"spanish_translation":"","french_translation":"","german_translation":"","italian_translation":"","polish_translation":"","japanese_translation":"","chinese_translation":"","footnotes":""},"categories":[1],"tags":[165,517,524],"industry":[],"product":[],"coauthors":[528],"class_list":["post-4158","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","tag-academic","tag-curriculum","tag-curriculum-hub"],"featured_image_url":"https:\/\/blogs.sw.siemens.com\/wp-content\/uploads\/sites\/11\/2021\/04\/design-for-test.jpg","_links":{"self":[{"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/posts\/4158","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/users\/72538"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/comments?post=4158"}],"version-history":[{"count":1,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/posts\/4158\/revisions"}],"predecessor-version":[{"id":4160,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/posts\/4158\/revisions\/4160"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/media\/4159"}],"wp:attachment":[{"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/media?parent=4158"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/categories?post=4158"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/tags?post=4158"},{"taxonomy":"industry","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/industry?post=4158"},{"taxonomy":"product","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/product?post=4158"},{"taxonomy":"author","embeddable":true,"href":"https:\/\/blogs.sw.siemens.com\/academic\/wp-json\/wp\/v2\/coauthors?post=4158"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}